Electrical characteristics
STM32F105xx, STM32F107xx
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with SAE
IEC61967-2 standard which specifies the test board and the pin loading.
Table 32. EMI characteristics
Max vs. [fHSE/fHCLK
]
Monitored
Symbol
Parameter
Conditions
Unit
frequency band
8/48 MHz
8/72 MHz
0.1 to 30 MHz
30 to 130 MHz
130 MHz to 1GHz
SAE EMI Level
9
26
25
4
9
13
31
4
VDD = 3.3 V, TA = 25 °C,
Peak level LQFP100 package
dBµV
-
SEMI
compliant with IEC61967-2
5.3.11
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 33. ESD absolute maximum ratings
Symbol
Ratings
Conditions
Class Maximum value(1) Unit
Electrostatic discharge voltage TA = +25 °C conforming to
(human body model) JESD22-A114
VESD(HBM)
2
2000
500
V
Electrostatic discharge voltage TA = +25 °C conforming to
(charge device model) JESD22-C101
VESD(CDM)
II
1. Based on characterization results, not tested in production.
Static latch-up
Two complementary static tests are required on six parts to assess the latch-up
performance:
●
A supply overvoltage is applied to each power supply pin
●
A current injection is applied to each input, output and configurable I/O pin
These tests are compliant with EIA/JESD 78A IC latch-up standard.
Table 34. Electrical sensitivities
Symbol
Parameter
Conditions
Class
LU
Static latch-up class
TA = +105 °C conforming to JESD78A
II level A
54/104
Doc ID 15274 Rev 6
STMICROELECTRONICS [ ST ]
