8 Mbit Firmware Hub
SST49LF008A
Data Sheet
V
V
TH
TL
V
CLK
TEST
T
SU
T
DH
FWH [3:0]
(Valid Input Data)
Inputs
Valid
V
MAX
1161 F14.0
FIGURE 11: Input Timing Parameters
TABLE 18: Interface Measurement Condition Parameters
Symbol
Value
0.6 VDD
0.2 VDD
0.4 VDD
0.4 VDD
1 V/ns
Units
1
VTH
V
V
V
V
1
VTL
VTEST
1
VMAX
Input Signal Edge Rate
T18.3 1161
1. The input test environment is done with 0.1 VDD of overdrive over VIH and VIL.
Timing parameters must be met with no more overdrive than this.
V
MAX specified the maximum peak-to-peak waveform allowed for measuring
input timing. Production testing may use different voltage values, but must
correlate results back to these parameters.
©2006 Silicon Storage Technology, Inc.
S71161-11-000
3/06
26
SST [ SILICON STORAGE TECHNOLOGY, INC ]
