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U632H64BS2K25G1 参数 Datasheet PDF下载

U632H64BS2K25G1图片预览
型号: U632H64BS2K25G1
PDF下载: 下载PDF文件 查看货源
内容描述: PowerStore 8K ×8的nvSRAM [PowerStore 8K x 8 nvSRAM]
分类和应用: 存储内存集成电路静态存储器光电二极管
文件页数/大小: 15 页 / 410 K
品牌: SIMTEK [ SIMTEK CORPORATION ]
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U632H64  
VCCX  
VSS  
Block Diagram  
EEPROM Array  
128 x (64 x 8)  
VCAP  
STORE  
A5  
A6  
A7  
A8  
SRAM  
Array  
RECALL  
VCCX  
VCAP  
Power  
Control  
128 Rows x  
64 x 8 Columns  
A9  
A11  
A12  
Store/  
Recall  
Control  
HSB  
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
Column I/O  
Software  
Detect  
A0 - A12  
Column Decoder  
G
A0 A1 A2 A3 A4A10  
DQ7  
E
W
Truth Table for SRAM Operations  
Operating Mode  
E
HSB  
W
G
DQ0 - DQ7  
Standby/not selected  
Internal Read  
Read  
H
L
L
L
H
H
H
H
High-Z  
High-Z  
*
*
H
H
H
L
L
Data Outputs Low-Z  
Data Inputs High-Z  
Write  
*
* H or L  
Characteristics  
All voltages are referenced to VSS = 0 V (ground).  
All characteristics are valid in the power supply voltage range and in the operating temperature range specified.  
Dynamic measurements are based on a rise and fall time of 5 ns, measured between 10 % and 90 % of VI, as well as input levels of VIL = 0 V  
and VIH = 3 V. The timing reference level of all input and output signals is 1.5 V,  
with the exception of the tdis-times and ten-times, in which cases transition is measured 200 mV from steady-state voltage.  
Absolute Maximum Ratingsa  
Symbol  
Min.  
Max.  
Unit  
Power Supply Voltage  
Input Voltage  
VCC  
VI  
-0.5  
-0.3  
-0.3  
7
V
V
VCC+0.5  
VCC+0.5  
1
Output Voltage  
VO  
PD  
Ta  
V
Power Dissipation  
W
Operating Temperature  
C-Type  
K-Type  
0
-40  
70  
85  
°C  
°C  
Storage Temperature  
Tstg  
-65  
150  
°C  
a: Stresses greater than those listed under „Absolute Maximum Ratings“ may cause permanent damage to the device. This is a stress  
rating only, and functional operation of the device at condition above those indicated in the operational sections of this specification is  
not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability  
Rev 1.1  
August 15, 2006  
STK Control #ML0047  
2