Si1000/1/2/3/4/5
Table 4.18. Receiver AC Electrical Characteristics1
Parameter
Symbol
Conditions
Min
240
—
Typ
—
Max Units
RX Frequence Range
960
—
MHz
dBm
F
RX
2
(BER < 0.1%)
(2 kbps, GFSK, BT = 0.5,
f = 5 kHz)3
RX Sensitivity
–121
P
RX_2
(BER < 0.1%)
(40 kbps, GFSK, BT = 0.5,
f = 20 kHz)3
(BER < 0.1%)
(100 kbps, GFSK, BT = 0.5,
f = 50 kHz)3
(BER < 0.1%)
(125 kbps, GFSK, BT = 0.5,
f = 62.5 kHz)
—
—
—
–108
–104
–101
—
—
—
dBm
dBm
dBm
P
RX_40
P
P
RX_100
RX_125
(BER < 0.1%)
—
—
–110
–102
—
—
dBm
dBm
P
RX_OOK
(4.8 kbps, 350 kHz BW, OOK)3
(BER < 0.1%)
(40 kbps, 400 kHz BW, OOK)3
3
RX Channel Bandwidth
2.6
—
—
0
620
0.1
kHz
BW
Up to +5 dBm Input Level
BER Variation vs Power
ppm
P
RX_RES
3
Level
3
915 MHz
868 MHz
433 MHz
315 MHz
LNA Input Impedance
—
—
—
—
—
—
—
—
51–60j
54–63j
89–110j
107–137j
±0.5
—
—
—
—
—
—
—
—
R
IN-RX
(Unmatched—measured
differentially across RX
input pins)
RSSI Resolution
dB
dB
dB
dB
RES
RSSI
1-CH
2-CH
3-CH
3
Desired Ref Signal 3 dB above
sensitivity, BER < 0.1%. Interferer
and desired modulated with
40 kbps F = 20 kHz GFSK with BT
= 0.5, channel spacing = 150 kHz
1-Ch Offset Selectivity
–31
C/I
C/I
C/I
3
2-Ch Offset Selectivity
–35
3
3-Ch Offset Selectivity
–40
3
Desired Ref Signal 3 dB above
sensitivity. Interferer and desired
modulated with 40 kbps F =
20 kHz GFSK with BT = 0.5
Blocking at 1 MHz Offset
Blocking at 4 MHz Offset
Blocking at 8 MHz Offset
—
—
—
—
–52
–56
–63
–30
—
—
—
—
dB
dB
dB
dB
1M
4M
8M
BLOCK
BLOCK
BLOCK
3
3
3
Rejection at the image frequency.
IF=937 kHz
Image Rejection
Im
REJ
3
Measured at RX pins
Spurious Emissions
—
—
–54
dBm
P
OB_RX1
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max
limits are listed in the "Production Test Conditions" section on page 73.
2. Receive sensitivity at multiples of 30 MHz may be degraded. If channels with a multiple of 30 MHz are required
it is recommended to shift the crystal frequency. Contact Silicon Labs Applications Support for
recommendations.
3. Guaranteed by qualification. Qualification test conditions are listed in the "Production Test Conditions" section
on page 73.
68
Rev. 1.0
SILICON [ SILICON ]
