BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.1.9_00
Table 13
S-8261ABH
Test
Test
Parameter
Symbol
Remark
Min. Typ. Max. Unit
condition
circuit
[DELAY TIME] 25°C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
0.24
29
0.3
36
0.36
43
s
5
5
5
5
ms
ms
ms
tlOV1
14
18
22
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
1.8
2.24
2.7
tSHORT
10
220
320
380
5
µs
[DELAY TIME]
−40°C to
+
85°C*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
0.17
20
0.3
36
0.51
61
s
5
5
5
5
ms
ms
ms
tlOV1
10
18
31
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
1.2
2.24
3.8
tSHORT
10
150
320
540
5
µs
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
14
Seiko Instruments Inc.