BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.1.9_00
S-8261ABD
Table 11
Test
Test
Parameter
Symbol
Remark
Min. Typ. Max. Unit
condition
circuit
[DELAY TIME] 25°C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
1.48 1.84
2.2
138
8.8
s
5
5
5
5
92
115
7.2
3.6
ms
ms
ms
tlOV1
5.76
2.88
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
4.32
tSHORT
10
358
488
586
5
µs
[DELAY TIME]
−40°C to
+
85°C*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
1.11 1.84 2.89
s
5
5
5
5
68.9 115 182.3 ms
tlOV1
4.31
2.16
7.2 11.59 ms
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
3.6
5.68
ms
tSHORT
10
268
488
770
5
µs
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Table 12
S-8261ABG, S-8261ABI, S-8261ABL
Test
Test
Parameter
Symbol
Remark
Min. Typ. Max. Unit
condition
circuit
[DELAY TIME] 25°C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
0.96
29
7.2
1.8
1.2
36
1.4
43
s
5
5
5
5
ms
ms
ms
tlOV1
9
11
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
2.24
2.7
tSHORT
10
220
320
380
5
µs
[DELAY TIME]
−40°C to
+
85°C*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
0.7
20
5
1.2
36
2.0
61
s
5
5
5
5
ms
ms
ms
tlOV1
9
15
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
1.2
2.24
3.8
tSHORT
10
150
320
540
5
µs
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Seiko Instruments Inc.
13
SII [ SEIKO INSTRUMENTS INC ]
