BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.1.9_00
3. Detection Delay Time
Table 7
S-8261AAG, S-8261AAH, S-8261AAJ, S-8261AAL, S-8261AAM, S-8261AAN, S-8261AAO, S-8261AAP,
S-8261AAR, S-8261AAZ, S-8261ABB, S-8261ABC, S-8261ABE, S-8261ABJ, S-8261ABK, S-8261ABM,
S-8261ABN, S-8261ABO, S-8261ABP, S-8261ABR, S-8261ABS
Test
Test
Parameter
Symbol
Remark
Min. Typ. Max. Unit
condition
circuit
[DELAY TIME] 25 °C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
0.96
115
7.2
1.2
144
9
1.4
173
11
s
5
5
5
5
ms
ms
ms
tlOV1
10
10
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
1.8
2.24
2.7
tSHORT
10
220
320
380
5
µs
[DELAY TIME]
−40 °C to
+
85 °C*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
0.7
80
5
1.2
144
9
2.0
245
15
s
5
5
5
5
ms
ms
ms
tlOV1
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
1.2
2.24
3.8
tSHORT
10
150
320
540
5
µs
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Table 8
S-8261AAS
Test
Test
Parameter
Symbol
Remark
Min. Typ. Max. Unit
condition
circuit
[DELAY TIME] 25 °C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
0.96
115
3.6
1.2
144
4.5
1.4
173
5.4
2.7
s
5
5
5
5
ms
ms
ms
tlOV1
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
1.8
2.24
tSHORT
10
220
320
380
5
µs
[DELAY TIME]
−40 °C to
+
85 °C*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
0.7
80
2.5
1.2
1.2
144
4.5
2.0
245
7.7
3.8
s
5
5
5
5
ms
ms
ms
tlOV1
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
2.24
tSHORT
10
150
320
540
5
µs
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Seiko Instruments Inc.
11
SII [ SEIKO INSTRUMENTS INC ]
