BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.1.9_00
Table 9
S-8261AAU, S-8261AAX, S-8261ABA
Test
Test
Parameter
Symbol
Remark
Min. Typ. Max. Unit
condition
circuit
[DELAY TIME] 25 °C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
3.7
115
7.2
1.8
4.6
144
9
5.5
173
11
s
5
5
5
5
ms
ms
ms
tlOV1
10
10
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
2.24
2.7
tSHORT
10
220
320
380
5
µs
[DELAY TIME]
−40 °C to
+
85 °C*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
2.5
80
5
4.6
144
9
7.8
245
15
s
5
5
5
5
ms
ms
ms
tlOV1
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
1.2
2.24
3.8
tSHORT
10
150
320
540
5
µs
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Table 10
S-8261AAV
Test
Test
Parameter
Symbol
Remark
Min. Typ. Max. Unit
condition
circuit
[DELAY TIME] 25 °C
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
3.7
115
7.2
3.6
4.6
144
9
5.5
173
11
s
5
5
5
5
ms
ms
ms
tlOV1
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
4.5
5.4
tSHORT
10
450
600
720
5
µs
[DELAY TIME]
−40 °C to
+
85 °C*1
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
tCU
tDL
9
9
10
10
2.5
80
5
4.6
144
9
7.8
245
15
s
5
5
5
5
ms
ms
ms
tlOV1
Overcurrent 2 detection delay time
Load short-circuiting detection delay
time
tlOV2
2.5
4.5
7.7
tSHORT
10
310
600 1020
5
µs
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
12
Seiko Instruments Inc.