BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211C Series
Rev.5.0
_00
(7) S-8211CBN
Table 16
Test
Test
Unit Condi-
Circuit
tion
ms
ms
ms
µs
ms
ms
ms
ms
µs
ms
9
9
10
10
10
9
9
10
10
10
5
5
5
5
5
5
5
5
5
5
Item
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta =
−40
to
+85
°C)
*1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
Symbol
Condition
Min.
Typ.
Max.
t
CU
t
DL
t
DIOV
t
SHORT
t
CIOV
t
CU
t
DL
t
DIOV
t
SHORT
t
CIOV
−
−
−
−
−
−
−
−
−
−
458
120
3.6
240
3.6
334
83
2.5
150
2.5
573
150
4.5
300
4.5
573
150
4.5
300
4.5
687
180
5.4
360
5.4
955
255
7.7
540
7.7
*1.
Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
14
Seiko Instruments Inc.
SII [ SEIKO INSTRUMENTS INC ]
