Rev.5.0
_00
3. Detection Delay Time
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211C Series
(1) S-8211CAA, S-8211CAH, S-8211CAI, S-8211CAJ, S-8211CAK,S-8211CAL, S-8211CAM, S-8211CAN, S-
8211CAR, S-8211CAS, S-8211CAU, S-8211CAY,S-8211CAZ, S-8211CBA, S-8211CBB
Table 10
Item
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta =
−40
to
+85
°C)
*1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
t
CU
t
DL
t
DIOV
t
SHORT
t
CIOV
−
−
−
−
−
0.7
83
5
150
5
1.2
150
9
300
9
2.0
255
15
540
15
s
ms
ms
µs
ms
9
9
10
10
10
5
5
5
5
5
t
CU
t
DL
t
DIOV
t
SHORT
t
CIOV
−
−
−
−
−
0.96
120
7.2
240
7.2
1.2
150
9
300
9
1.4
180
11
360
11
s
ms
ms
µs
ms
9
9
10
10
10
5
5
5
5
5
Symbol
Condition
Min.
Typ.
Max.
Test
Test
Unit Condi-
Circuit
tion
*1.
Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
(2) S-8211CAB, S-8211CAV
Table 11
Item
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta =
−40
to
+85
°C)
*1
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
t
CU
t
DL
t
DIOV
t
SHORT
t
CIOV
−
−
−
−
−
0.7
83
5
260
5
1.2
150
9
560
9
2.0
255
15
940
15
s
ms
ms
µs
ms
9
9
10
10
10
5
5
5
5
5
t
CU
t
DL
t
DIOV
t
SHORT
t
CIOV
−
−
−
−
−
0.96
120
7.2
450
7.2
1.2
150
9
560
9
1.4
180
11
670
11
s
ms
ms
µs
ms
9
9
10
10
10
5
5
5
5
5
Symbol
Condition
Min.
Typ.
Max.
Test
Test
Unit Condi-
Circuit
tion
*1.
Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
by design, not tested in production.
Seiko Instruments Inc.
11
SII [ SEIKO INSTRUMENTS INC ]
