LH28F800SU
8M (512K × 16, 1M × 8) Flash Memory
Capacitance
For 3.3 V Systems
SYMBOL
PARAMETER
TYP.
MAX. UNITS
TEST CONDITIONS
TA = 25°C, f = 1.0 MHz
TA = 25°C, f = 1.0 MHz
For VCC = 3.3 V ±0.3 V
50 Ω transmission line delay
NOTE
Capacitance Looking into an
Address/Control Pin
6
8
CIN
pF
pF
pF
ns
1
1
1
COUT
CLOAD
Capacitance Looking into an Output Pin
8
12
50
2.5
Load Capacitance Driven by Outputs for
Timing Specifications
Equivalent Testing Load Circuit
Capacitance
For 5.0 V Systems
SYMBOL
PARAMETER
TYP.
MAX. UNITS
TEST CONDITIONS
TA = 25°C, f = 1.0 MHz
TA = 25°C, f = 1.0 MHz
For VCC = 5.0 V ±05 V
NOTE
Capacitance Looking into an
Address/Control Pin
6
8
8
CIN
pF
pF
pF
1
1
1
COUT
CLOAD
Capacitance Looking into an Output Pin
12
Load Capacitance Driven by Outputs for
Timing Specifications
100
Equivalent Testing Load Circuit VCC ± 10%
Equivalent Testing Load Circuit VCC ± 5%
2.5
2.5
ns
ns
25 Ω transmission line delay
83 Ω transmission line delay
NOTE:
1. Sampled, not 100% tested.
16
SHARP [ SHARP ELECTRIONIC COMPONENTS ]
