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K9F5616Q0B-DIB0 参数 Datasheet PDF下载

K9F5616Q0B-DIB0图片预览
型号: K9F5616Q0B-DIB0
PDF下载: 下载PDF文件 查看货源
内容描述: 32M ×8位, 16M x 16位NAND闪存 [32M x 8 Bit , 16M x 16 Bit NAND Flash Memory]
分类和应用: 闪存
文件页数/大小: 34 页 / 602 K
品牌: SAMSUNG [ SAMSUNG ]
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K9F5608U0B-VCB0,VIB0,FCB0,FIB0  
K9F5608Q0B-DCB0,DIB0,HCB0,HIB0  
K9F5608U0B-YCB0,YIB0,PCB0,PIB0  
K9F5608U0B-DCB0,DIB0,HCB0,HIB0  
K9F5616Q0B-DCB0,DIB0,HCB0,HIB0  
K9F5616U0B-YCB0,YIB0,PCB0,PIB0  
K9F5616U0B-DCB0,DIB0,HCB0,HIB0  
FLASH MEMORY  
System Interface Using CE don’t-care.  
For an easier system interface, CE may be inactive during the data-loading or sequential data-reading as shown below. The internal  
528byte/264word page registers are utilized as seperate buffers for this operation and the system design gets more flexible. In addi-  
tion, for voice or audio applications which use slow cycle time on the order of u-seconds, de-activating CE during the data-loading  
and reading would provide significant savings in power consumption.  
Figure 6. Program Operation with CE don’t-care.  
CLE  
CE don’t-care  
CE  
WE  
ALE  
I/Ox  
80h  
Start Add.(3Cycle)  
Data Input  
Data Input  
10h  
tCS  
tCH  
tCEA  
CE  
RE  
CE  
tREA  
tWP  
WE  
I/O0~15  
out  
Figure 7. Read Operation with CE don’t-care.  
CLE  
On K9F5608U0B_Y,P or K9F5608U0B_V,F  
CE must be held  
low during tR  
CE don’t-care  
CE  
RE  
ALE  
tR  
R/B  
WE  
I/Ox  
Data Output(sequential)  
00h  
Start Add.(3Cycle)  
19  
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