K6T0808C1D Family
CMOS SRAM
AC OPERATING CONDITIONS
TEST CONDITIONS (Test Load and Test Input/Output Reference)
Input pulse level : 0.8 to 2.4V
1)
Input rising and falling time : 5ns
CL
Input and output reference voltage : 1.5V
Output load (See right) :CL=100pF+1TTL
CL=50pF+1TTL
1. Including scope and jig capacitance
AC CHARACTERISTICS (Vcc=4.5~5.5V, K6T0808C1D-L Family:TA=0 to 70°C, K6T0808C1D-P Family:TA=-40 to 85°C)
Speed Bins
Parameter List
Symbol
Units
551)ns
Max
70ns
Min
55
-
Min
70
-
Max
Read cycle time
tRC
tAA
-
55
55
25
-
-
70
70
35
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Address access time
Chip select to output
tCO
tOE
-
-
Output enable to valid output
Chip select to low-Z output
Output enable to low-Z output
Chip disable to high-Z output
Output disable to high-Z output
Output hold from address change
Write cycle time
-
-
Read
tLZ
10
5
10
5
tOLZ
tHZ
-
-
0
20
20
-
0
30
30
-
tOHZ
tOH
tWC
tCW
tAS
0
0
10
55
45
0
10
70
60
0
-
-
Chip select to end of write
Address set-up time
-
-
-
-
Address valid to end of write
Write pulse width
tAW
tWP
tWR
tWHZ
tDW
tDH
45
40
0
-
60
50
0
-
-
-
Write
Write recovery time
-
-
Write to output high-Z
0
20
-
0
25
-
Data to write time overlap
Data hold from write time
End write to output low-Z
25
0
30
0
-
-
tOW
5
-
5
-
1. The parameter is tested with 50pF test load.
DATA RETENTION CHARACTERISTICS
Item
Symbol
Test Condition
Min
Typ
Max
5.5
15
3
Unit
Vcc for data retention
VDR
CS³ Vcc-0.2V
2.0
-
-
1
V
L-Ver
Data retention current
IDR
Vcc=3.0V, CS³ Vcc-0.2V
mA
LL-Ver
-
0.2
-
Data retention set-up time
Recovery time
tSDR
tRDR
0
-
See data retention waveform
ms
5
-
-
Revision 1.0
November 1997
SAMSUNG [ SAMSUNG ]
