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HYE18M1G16 参数 Datasheet PDF下载

HYE18M1G16图片预览
型号: HYE18M1G16
PDF下载: 下载PDF文件 查看货源
内容描述: 1千兆位x16的移动DDR -RAM [1-Gbit x16 DDR Mobile-RAM]
分类和应用: 双倍数据速率
文件页数/大小: 65 页 / 3507 K
品牌: QIMONDA [ QIMONDA AG ]
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Data Sheet  
HY[B/E]18M1G16[0/1]BF  
1-Gbit DDR Mobile-RAM  
Parameter  
Symbol  
- 6  
- 7.5  
Unit Note  
min.  
max.  
min.  
22.5  
22.5  
max.  
6)  
ACTIVE to READ or WRITE delay  
tRCD  
tRP  
18  
18  
ns  
6)  
PRECHARGE command period  
ns  
1) The output timing reference level is VDDQ/2.  
2) Parameters tAC and tQH are specified for full drive strength and a reference load of 20pF. This reference load is not intended to be either a  
precise representation of the typical system environment nor a depiction of the actual load presented by a production tester. For half drive  
strength with a nominal load of 10pF parameters tAC and tQH are expected to be in the same range. However, these parameters are not  
subject to production test but are estimated by device characterization. Use of IBIS or other simulation tools for system validation is  
suggested.  
3)  
tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred to a specific  
voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).  
4)tDQSQ consists of data ball skew and output pattern effects, and p-channel to n-channel variation of the output drivers for any  
given cycle.  
5)  
tQH = tHP - tQHS, where tHP = minimum half clock period for any given cycle and is defined by clock high or clock low (tCL, tCH).tQHS accounts  
for 1) the pulse duration distortion of on-chip clock circuits; and 2) the worst case push-out of DQS on one transition followed by the worst  
case pull-in of DQ on the next transition, both of which are, separately, due to data ball skew and output pattern effects, and p-channel to  
n-channel variation of the output drivers.  
6) These parameters account for the number of clock cycles and depend on the operating frequency, as follows:  
no. of clock cycles = specified delay / clock period; round to the next higher integer.  
During READ bursts, the valid data-out element from the starting column address will be available following the CAS latency  
after the READ command.  
The diagrams in Figure 14 show general timing for each supported CAS latency setting. DQS is driven by the DDR Mobile-  
RAM along with output data. The initial low state on DQS is known as the read preamble; the low state coincident with the last  
data-out element is known as the read postamble.  
Upon completion of a burst, assuming no other READ commands have been initiated, the DQs will go High-Z.  
FIGURE 14  
READ Burst  
CK  
CK  
Command  
READ  
NOP  
NOP  
NOP  
NOP  
NOP  
Address  
BA,Col n  
CL=2  
DQS  
DQ  
DO n  
CL=3  
DQS  
DQ  
DO n  
= Don't Care  
DO n = Data Out from column n  
BA, Col n = Bank A, Column n  
Burst Length = 4; 3 subsequent elements of Data Out appear in the programmed order following DO n  
Rev.1.0, 2007-03  
10242006-Y557-TZXW  
24  
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