PM7340 S/UNI-IMA-8
PRELIMINARY
INVERSE MULTIPLEXING OVER ATM
DATA SHEET
PMC-2001723
ISSUE 3
INVERSE MULTIPLEXING OVER ATM
9.8 JTAG & Scan Interface (7 Signals)
Pin Name
Type
Pin
No.
Function
TCK
Input
B21
The Test Clock (TCK) signal provides timing for test
operations that are carried out using the IEEE
P1149.1 test access port.
TMS
TDI
Input
Input
A21
The Test Mode Select (TMS) is an active high signal
that controls the test operations carried out using the
IEEE P1149.1 test access port.
The TMS signal has an integral pull-up resistor.
The TMS input is sampled on the rising edge of TCK.
The Test Data Input (TDI) signal carries test data
into the S/UNI-IMA-8 via the IEEE P1149.1 test
access port.
B20
The TDI signal has an integral pull-up resistor.
The TDI input is sampled on the rising edge of TCK.
TDO
Tristate B19
The Test Data Output (TDO) signal carries test data
out of the S/UNI-IMA-8 via the IEEE P1149.1 test
access port. TDO is a tristate output that is inactive
except when the scanning of data is in progress.
The TDO output is updated/tristated on the falling
edge of TCK.
TRSTB
Input
C18
D7
The Active low Test Reset (TRSTB) is an active low
signal that provides an asynchronous S/UNI-IMA-8
test access port reset via the IEEE P1149.1 test
access port. TRSTB is a Schmitt-triggered input with
an integral pull-up resistor.
Note that when not being used, TRSTB must be
connected to the RSTB input.
SCAN_MODE Input
B
The Active low Scan Mode (SCAN_MODEB) is an
active low signal that places the S/UNI-IMA-8 into a
manufacturing test mode.
PROPRIETARY AND CONFIDENTIAL TO PMC-SIERRA, INC., AND FOR ITS CUSTOMERS’ INTERNAL USE
37
PMC [ PMC-SIERRA, INC ]
