Philips Semiconductors
Product specification
Low power FM IF system
SA614A
F
1
NE614A TEST CIRCUIT
C
4
Q = 20 LOADED
C
R
1
C
2
2
C
C
5
6
R
3
INPUT
F
2
R
1
16
15
14
13
12
11
10
9
8
C
7
SA614A
C
3
1
2
3
4
5
6
7
C
8
C
9
S
C
1
10
R
4
C
AUDIO
OUTPUT
DATA
OUTPUT
12
C
11
RSSI
OUTPUT
MUTE
INPUT
C1 100nF + 80 – 20% 63V K10000–25V Ceramic
SIGNETICS
NE614 TEST CKT
100nF +10% 50V
100nF +10% 50V
C2
C3
100nF +10% 50V
C4
100nF +10% 50V
C5
C6
10pF +2% 100V NPO Ceramic
100nF +10% 50V
C7
100nF +10% 50V
C8
15nF +10% 50V
C9
150pF +2% 100V N1500 Ceramic
1nF +10% 100V K2000-Y5P Ceramic
C10
C11
6.8µF +20% 25V Tantalum
C12
F1 455kHz Ceramic Filter Murata SFG455A3
455kHz (Ce = 180pF) TOKO RMC 2A6597H
F2
R1
51Ω +1% 1/4W Metal Film
1500Ω +1% 1/4W Metal Film
R2
1500Ω +5% 1/8W Carbon Composition
100kΩ +1% 1/4W Metal Film
R3
R4
SIGNETICS
NE614 TEST CKT
SR00325
Figure 3. SA614A Test Circuit
5
1997 Nov 07
NXP [ NXP ]
