Philips Semiconductors
Product data
Single wire CAN transceiver
AU5790
TEST CIRCUITS
5.1V
TxD
GND
CANH
RTH
BAT
S1
NSTB
AU5790
1 µF
1.5 k
EN
9.1 kΩ
S2
RxD
S3
I_CAN_LG
2.4 kΩ
V
BAT
SL01234
Figure 3.
Loss of ground test circuit
NOTES:
Opening S3 simulates loss of module ground.
Check I_CAN_LG with the following switch positions to simulate loss of ground in all modes:
1. S1 = open = S2
2. S1 = open, S2 = closed
3. S1 = closed, S2 = open
4. S1 = closed = S2
12
2001 May 18