NXP Semiconductors
74HC132; 74HCT132
Quad 2-input NAND Schmitt trigger
12. Waveforms
V
I
nA, nB input
GND
t
PHL
V
OH
nY output
V
OL
t
THL
V
Y
V
M
V
X
t
TLH
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V
M
t
PLH
Measurement points are given in
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 5.
Table 8.
Type
74HC132
Input to output propagation delays
Measurement points
Input
V
M
0.5V
CC
1.3 V
Output
V
M
0.5V
CC
1.3 V
V
X
0.1V
CC
0.1V
CC
V
Y
0.9V
CC
0.9V
CC
74HCT132
V
I
negative
pulse
GND
t
W
90 %
V
M
10 %
t
f
t
r
t
r
t
f
90 %
V
M
10 %
t
W
V
CC
G
VI
VO
V
M
V
I
positive
pulse
GND
V
M
DUT
RT
CL
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Test data is given in
Definitions test circuit:
R
T
= termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= load capacitance including jig and probe capacitance.
Fig 6.
Load circuitry for measuring switching times
74HC_HCT132
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© NXP B.V. 2012. All rights reserved.
Product data sheet
Rev. 3 — 30 August 2012
7 of 20
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