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ML7033 参数 Datasheet PDF下载

ML7033图片预览
型号: ML7033
PDF下载: 下载PDF文件 查看货源
内容描述: 双通道线路卡CODEC [Dual-Channel Line Card CODEC]
分类和应用:
文件页数/大小: 51 页 / 442 K
品牌: OKI [ OKI ELECTRONIC COMPONETS ]
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FEDL7033-02  
ML7033  
1
Semiconductor  
The INT pin is released to the logic “1” state in either of the following cases;  
(1) (PDN pin = logic “1”) Any one of the ALMn or DETn pins in the logic “0” state transition to the logic “1”  
state.  
(2) (PDN pin = logic “0”) All of the ALMn or DETn pins in the logic “0” state transition to the logic “1”  
state.  
(3) Both SLIC 1 control (CR6 register) and SLIC 2 control (CR13 register) are read by the MCU.  
Note that the debounce timer, which works when the DETn pin changes from a logic “1” state to a to logic “0”  
state, does not work when the pin changes from logic “0” to logic “1”.  
DEN, EXCK, DIO  
Serial control ports for the MCU interface. These pins are used by an external MCU to access the internal control  
registers of the ML7033. The DEN pin is the data enable input. The EXCK pin is the data shift clock input. The  
DIO pin is the address and data input/output. Figure 9 shows the MCU interface input/output timing diagram.  
Note that EXCK must be a continuous clock of at least 15 pulses or more.  
DEN  
EXCK  
DIO (I)  
W
R
A4 A3 A2 A1 A0 B7 B6 B5 B4 B3 B2 B1 B0  
Write timing  
DEN  
EXCK  
Output  
Input  
DIO (O)  
A4 A3 A2 A1 A0 B7 B6 B5 B4 B3 B2 B1 B0  
Read timing  
Figure 9 MCU Interface Timing Diagram  
CIDATA1, CIDATA2  
The CIDATA1 and CDATA2 data inputs are used for Caller ID generation. While in a Caller ID tone generation  
mode with the CIDCHnON register bit set, (CR1-B1/CR1-B0), signals on the CIDATAn pins are modulated in  
either the ITU-T V.23 or Bell 202 schemes. The scheme is determined by the CIDFMT register bit (CR1-B2),  
and output from the analog output pin(s).  
The analog output pins for modulated Caller ID data can be selected by the CHnTG2TX (CR7-B6/CR14-B6),  
the CHnTGTOUTn (CR7-B5/CR14-B5), and the AOUTnSEL (CR7-B7/CR14-B7) register bits.  
The output level for the modulated Caller ID data can be tuned by the CHnTG1LVn (CR9-B7 to B1/CR16-B7 to  
B1) register bits.  
TEST  
The TEST input is used for testing purposes only during the manufacturing process and has no function once the  
testing process is completed. This pin is not used during normal operation of the device and should be kept at a  
logic “0” state.  
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