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TJA1055 参数 Datasheet PDF下载

TJA1055图片预览
型号: TJA1055
PDF下载: 下载PDF文件 查看货源
内容描述: 增强的容错CAN收发器 [Enhanced fault-tolerant CAN transceiver]
分类和应用:
文件页数/大小: 26 页 / 146 K
品牌: NXP [ NXP ]
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TJA1055  
NXP Semiconductors  
Enhanced fault-tolerant CAN transceiver  
Table 9.  
Dynamic characteristics …continued  
VCC = 4.75 V to 5.25 V; VBAT = 5.0 V to 40 V; VSTB = VCC; Tvj = 40 °C to +150 °C; all voltages are defined with respect to  
ground; unless otherwise specified.[1]  
Symbol  
Parameter  
Conditions  
Min Typ Max Unit  
tPD(H)  
propagation delay TXD (HIGH) to no failures; RCAN_L = RCAN_H = 125 ;  
-
-
-
-
-
1.5 µs  
1.9 µs  
1.9 µs  
RXD (HIGH)  
CCAN_L = CCAN_H = 1 nF; see Figure 4 to  
Figure 6  
all failures except CAN_L shorted to CAN_H;  
-
RCAN_L = RCAN_H = 125 ; CCAN_L  
=
CCAN_H = 1 nF; see Figure 4 to Figure 6  
failure 7, CAN_L shorted to CAN_H;  
RCAN_L = 1 M; RCAN_H = 125 ; CCAN_L  
-
=
CCAN_H = 1 nF; see Figure 4 to Figure 6  
[2]  
td(sleep)  
tdis(TxD)  
delay time to sleep  
5
50  
4
µs  
disable time of TxD permanent  
dominant timer  
normal operating mode; VTXD = 0 V  
0.75 -  
ms  
[2]  
[2]  
[2]  
tdom(CANH) dominant time on pin CANH  
tdom(CANL) dominant time on pin CANL  
low power modes; VBAT = 14 V  
low power modes; VBAT = 14 V  
7
7
7
-
-
-
38  
38  
38  
µs  
µs  
µs  
tWAKE  
local wake-up time on pin WAKE  
low power modes; VBAT = 14 V; for wake-up  
after receiving a falling or rising edge  
tdet  
failure detection time  
normal operating mode  
failures 3 and 3a  
1.6  
0.3  
-
-
8.0 ms  
1.6 ms  
failures 4, 6 and 7  
low power modes; VBAT = 14 V  
failures 3 and 3a  
1.6  
0.1  
-
-
8.0 ms  
1.6 ms  
failures 4 and 7  
trec  
failure recovery time  
normal operating mode  
failures 3 and 3a  
0.3  
7
-
-
-
1.6 ms  
failures 4 and 7  
38  
µs  
failure 6  
125  
750 µs  
low power modes; VBAT = 14 V  
failures 3, 3a, 4 and 7  
0.3  
-
-
1.6 ms  
-
ndet  
pulse-count failure detection  
difference between CANH and CANL;  
normal operating mode and failures 1, 2, 5  
and 6a; pin ERR becomes LOW  
4
nrec  
number of consecutive pulses for  
failure recovery  
on CANH and CANL simultaneously;  
failures 1, 2, 5 and 6a  
-
4
-
[1] All parameters are guaranteed over the virtual junction temperature range by design, but only 100 % tested at Tamb = 125 °C for dies on  
wafer level, and above this for cased products 100 % tested at Tamb = 25 °C, unless otherwise specified.  
[2] To guarantee a successful mode transition under all conditions, the maximum specified time must be applied.  
TJA1055_4  
© NXP B.V. 2009. All rights reserved.  
Product data sheet  
Rev. 04 — 17 February 2009  
15 of 26  
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