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LPC54616J512BD100 参数 Datasheet PDF下载

LPC54616J512BD100图片预览
型号: LPC54616J512BD100
PDF下载: 下载PDF文件 查看货源
内容描述: [32-bit ARM Cortex-M4 microcontroller]
分类和应用:
文件页数/大小: 169 页 / 3528 K
品牌: NXP [ NXP ]
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LPC546xx  
NXP Semiconductors  
32-bit ARM Cortex-M4 microcontroller  
[3] Tested in production. VDD = 1.71 V. At hot temperature and below 2.0 V, the supply current could increase slightly because of reduction  
of available RBB (reverse body bias) voltage.  
Table 17. Static characteristics: Power consumption in deep-sleep and deep power-down modes  
Tamb = 40 C to +105 C, unless otherwise specified, 2.7 V VDD 3.6 V.  
Symbol Parameter  
Conditions  
Min Typ[1][2] Max[3] Unit  
IDD  
supply current Deep-sleep mode; Flash is powered down  
SRAMX (32 KB) powered  
-
-
23  
-
69  
A  
A  
Tamb = 25 C  
SRAMX (32 KB) powered  
1150  
Tamb = 105 C  
Deep power-down mode  
RTC oscillator input grounded (RTC oscillator  
disabled)  
-
-
-
464  
-
1500  
42  
nA  
A  
nA  
Tamb = 25 C  
RTC oscillator input grounded (RTC oscillator  
disabled)  
Tamb = 105 C  
RTC oscillator running with external crystal  
VDD = VDDA= VREFP = 3.3 V, VBAT = 3.0 V  
550  
-
[1] Typical ratings are not guaranteed. Typical values listed are at room temperature (25 C), VDD = 3.3 V.  
[2] Characterized through bench measurements using typical samples.  
[3] Tested in production, VDD = 3.6 V.  
Table 18. Static characteristics: Power consumption in deep power-down mode  
Tamb = 40 C to +105 C, unless otherwise specified, 2.7 V VDD 3.6 V.  
Symbol Parameter  
Conditions  
Min Typ[1][2] Max  
Unit  
IBAT  
battery supply deep power-down mode;  
current  
RTC oscillator running with external crystal  
VDD = VDDA= VREFP = 3.3 V, VBAT = 3.0 V  
-
-
0
-
-
nA  
nA  
VDD = VDDA= VREFP = 0 V or tied to ground, VBAT =  
3.0 V  
340[3]  
[1] Typical ratings are not guaranteed. Typical values listed are at room temperature (25 C).  
[2] Characterized through bench measurements using typical samples.  
[3] If VBAT> VDD, the external reset pin must be floating to prevent high VBAT leakage.  
LPC546xx  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2.5 — 20 June 2018  
92 of 169  
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