DC and AC parameters
M29W800DT, M29W800DB
Figure 11. Read mode AC waveforms
tAVAV
VALID
A0-A18/
A–1
tAVQV
tAXQX
E
tELQV
tELQX
tEHQX
tEHQZ
G
tGLQX
tGLQV
tGHQX
tGHQZ
VALID
DQ0-DQ7/
DQ8-DQ15
tBHQV
BYTE
tELBL/tELBH
tBLQZ
AI05448
Table 12. Read AC characteristics
M29W800D
Symbol
Alt
Parameter
Test condition
Unit
45 ns
70 ns
90 ns
E = VIL,
Min
tAVAV
tAVQV
tRC
Address Valid to Next Address Valid
45
70
90
ns
ns
G = VIL
E = VIL,
Max
tACC Address Valid to Output Valid
45
70
90
G = VIL
(1)
tELQX
tLZ
Chip Enable Low to Output Transition
Chip Enable Low to Output Valid
G = VIL Min
G = VIL Max
0
0
0
ns
ns
ns
ns
ns
ns
tELQV
tCE
45
0
70
0
90
0
(1)
tGLQX
tOLZ Output Enable Low to Output Transition
E = VIL
Min
tGLQV
tOE
tHZ
tDF
Output Enable Low to Output Valid
Chip Enable High to Output Hi-Z
Output Enable High to Output Hi-Z
E = VIL Max
G = VIL Max
E = VIL Max
25
20
20
30
25
25
35
30
30
(1)
tEHQZ
(1)
tGHQZ
tEHQX
tGHQX
Chip Enable, Output Enable or Address
Transition to Output Transition
tOH
Min
0
5
0
5
0
5
ns
ns
tAXQX
tELBL
tELBH
tBLQZ
tBHQV
tELFL
tELFH
Chip Enable to BYTE Low or High
Max
tFLQZ BYTE Low to Output Hi-Z
tFHQV BYTE High to Output Valid
Max
Max
25
30
25
30
30
40
ns
ns
1. Sampled only, not 100% tested.
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