M29W800DT, M29W800DB
DC and AC parameters
Figure 10. AC measurement load circuit
V
V
CC
CC
25kΩ
DEVICE
UNDER
TEST
25kΩ
0.1µF
C
L
AI04499
C
includes JIG capacitance
L
(1)
Table 10. Device capacitance
Symbol
Parameter
Test condition
Min
Max
Unit
CIN
Input capacitance
Output capacitance
VIN = 0 V
6
pF
pF
COUT
VOUT = 0 V
12
1. Sampled only, not 100% tested.
Table 11. DC characteristics
Symbol
Parameter
Test condition
Min
Max
Unit
ILI
Input leakage current
Output leakage current
0 V ≤ VIN ≤ VCC
±1
±1
µA
µA
ILO
0 V ≤ VOUT ≤ VCC
E = VIL, G = VIH,
f = 6 MHz
ICC1
Supply current (read)
10
mA
µA
E = VCC ± 0.2 V,
RP = VCC ± 0.2 V
ICC2
Supply current (standby)
Supply current (program/erase)
100
Program/erase
controller active
(1)
ICC3
20
mA
VIL
VIH
VOL
VOH
VID
IID
Input low voltage
–0.5
0.8
V
V
Input high voltage
Output low voltage
Output high voltage
Identification voltage
Identification current
0.7VCC
VCC + 0.3
0.45
IOL = 1.8 mA
V
IOH = –100 µA
VCC – 0.4
11.5
V
12.5
100
V
A9 = VID
µA
Program/erase lockout supply
voltage
VLKO
1.8
2.3
V
1. Sampled only, not 100% tested.
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