MT8920B CMOS
Absolute Maximum Ratings* - Voltages are with respect to ground (V ) unless otherwise stated.
SS
Parameter
Symbol
Min
Max
Units
1
2
3
4
5
Supply Voltage
V
-0.3
-0.3
7.0
V
V
DD
Voltage on any I/O pin
Current on any I/O pin
Storage Temperature
Package Power Dissipation
V
+ 0.3
DD
I
±25
125
600
mA
°C
I/O
T
-55
ST
Plastic
P
mW
D
* Exceeding these values may cause permanent damage. Functional operation under these conditions is not implied.
Recommended Operating Conditions - Voltages are with respect to ground (V ) unless otherwise stated.
SS
‡
Characteristics
Supply Voltage
Sym
Min
Typ
Max Units
Test Conditions
1
2
3
4
5
V
4.75
2.4
0
5.0
5.25
V
V
DD
Input High Voltage
V
V
for 400mV noise margin
for 400mV noise margin
IH
DD
Input Low Voltage
V
0.4
85
V
IL
Operating Temperature
T
-40
25
°C
A
Operating Clock Frequency
f
4.096
MHz
CK
‡ Typical figures are at 25°C and are for design aid only: not guaranteed and not subject to production testing.
DC Electrical Characteristics - Voltages are with respect to ground (V ) unless otherwise stated.
SS
‡
Characteristics
Sym
Min
Typ
Max Units
Test Conditions
1
Supply Current
Static
Dynamic
I
I
10
5
µA
mA
outputs unloaded
@f = 4.096 MHz
CK
CCS
CCD
10
2
3
4
Input High Voltage
Input Low Voltage
V
2.0
V
IH
V
0.8
V
IL
Z
Input Leakage Current
I
±10
µA
V
=5.25V,
DD
V =V to V
IN
SS
DD
5
6
7
8
9
Input capacitance
C
10
pF
V
IN
Schmitt trigger input high (MMS)
Schmitt trigger input low (MMS)
Schmitt trigger hysteresis (MMS)
Output high current (except IRQ)
V
3.8
3.0
2.0
1.0
15
T+
V
1.0
V
T-
V
0.8
10
5
V
H
I
mA
mA
mA
µA
V
V
V
= 2.4V, V = 4.75V
DD
OH
OH
OL
OL
10 Output low current (except IRQ)
11 IRQ, DTACK, BUSY Sink Current
I
10
= 0.4V, V = 4.75V
DD
OL
OL
OZ
I
10
15
= 0.4V, V = 4.75V
DD
12 Tristate Leakage A -A , OE, WE
I
±1
±10
±20
15
V
V
= 5.25V
4
0
DD
(mode 3)
= V to V
OUT
SS DD
13 Open drain off-state current
IRQ, DTACK, BUSY
I
±1
µA
V
V
= 5.25V
DD
OFF
= V
OUT
DD
14 Output capacitance
C
pF
O
‡ Typical figures are at 25°C and are for design aid only: not guaranteed and not subject to production testing.
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