EEPROM
Austin Semiconductor, Inc.
AS8E512K8
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC READ OPERATING
CONDITIONS
(-55
o
C<T
A
<+125
o
C; Vcc = 5V +10%)
!" # "" !
A.C. READ WAVEFORMS
(1,2,3,4)
ADDRESS
CE\
t
CE
t
OE
t
ACC
OUTPUT
V
ALID
ADDRESS VALID
OE\
t
DF
t
OH
OUTPUT
HIGH Z
NOTES:
1. CE\ may be delayed up to t
ACC
-t
CE
after the address transi-
tion without inpact on t
ACC
.
2. OE\ may be delayed up to t
CE
-t
OE
after the falling edge of
CE\ without inpact on t
CE
or by t
ACC
-t
OE
after an address
change without inpact on t
ACC
.
3. t
DF
is specified from OE\ or CE\ whichever occurs first
(C
L
= 5pF).
4. This parameter is characterized and is not 100% tested.
5. A17 and A18 must remain valid through the WE\ and CE\
low pulse.
INPUT TEST WAVEFORMS AND MEASUREMENT
LEVEL FOR AC TEST CONDITIONS
In p ut P uls e L ev e ls
In p ut R is e a nd F a ll T im es
In p ut a n d O u tp ut
T im in g R e fe re nc e L e v els
AS8E512K8
Rev. 2.0 12/99
OUTPUT TEST LOAD
5.0V
1.8K
1.3K
100pF
0 V to 3 .0 V
5 nS
1 .5 V
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
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MICROSS [ MICROSS COMPONENTS ]
