EEPROM
AS8E512K8
Austin Semiconductor, Inc.
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC READ OPERATING
CONDITIONS (-55oC<TA<+125oC;Vcc = 5V +10%)
A.C. READ WAVEFORMS(1,2,3,4)
ADDRESS
CE\
ADDRESS VALID
tCE
tOE
OE\
tDF
tOH
tACC
HIGH Z
OUTPUT
VALID
OUTPUT
NOTES:
3. tDF is specified from OE\ or CE\ whichever occurs first
(CL = 5pF).
4. This parameter is characterized and is not 100% tested.
5. A17 and A18 must remain valid through the WE\ and CE\
low pulse.
1. CE\ may be delayed up to tACC-tCE after the address transi-
tion without inpact on tACC
.
2. OE\ may be delayed up to tCE-tOE after the falling edge of
CE\ without inpact on tCE or by tACC-tOE after an address
change without inpact on tACC
.
INPUT TEST WAVEFORMS AND MEASUREMENT
LEVEL FOR AC TEST CONDITIONS
OUTPUT TEST LOAD
5.0V
Input Pulse Levels
Input Rise and Fall Times
Input and Output
0V to 3.0V
5nS
1.8K
1.5V
100pF
1.3K
Timing Reference Levels
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
AS8E512K8
Rev. 2.0 12/99
4
MICROSS [ MICROSS COMPONENTS ]
