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N25Q128A11B1241F 参数 Datasheet PDF下载

N25Q128A11B1241F图片预览
型号: N25Q128A11B1241F
PDF下载: 下载PDF文件 查看货源
内容描述: 128兆位, 1.8 V ,多个I / O , 4 KB的界别分组擦除引导扇区, XIP启用,串行闪存与108 MHz的SPI总线接口 [128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, serial flash memory with 108 MHz SPI bus interface]
分类和应用: 闪存
文件页数/大小: 185 页 / 5874 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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Instructions  
N25Q128 - 1.8 V  
Figure 82. Program OTP instruction sequence QIO-SPI  
S
14  
9 10 11 12 13  
0
1
2
3
4
5
6
7
8
C
Data  
byte1 byte2  
Data  
Data  
Instruction  
24-Bit Address  
byten  
DQ0  
DQ1  
4
5
6
0
1
2
20 16 12 8  
21 17 13 9  
22 18 14 10  
23 19 15 11  
4
5
6
7
0
4
0
4
0
1
2
3
5
6
7
1
2
3
5
6
7
1
2
3
DQ2  
DQ3  
7
3
Quad_Program_OTP  
9.3.8  
Subsector Erase (SSE)  
For devices with a dedicated part number, at the bottom (or top) of the addressable area  
there are 8 boot sectors, each one having 16 4Kbytes subsectors. (See Section 16:  
Ordering information.) The Subsector Erase (SSE) instruction sets to '1' (FFh) all bits inside  
the chosen subsector. Before it can be accepted, a Write Enable (WREN) instruction must  
previously have been executed.  
Apart form the parallelizing of the instruction code and the address on the four pins DQ0,  
DQ1, DQ2 and DQ3, the instruction functionality is exactly the same as the Subsector Erase  
(SSE) instruction of the Extended SPI protocol, please refer to Section 9.1.17: Subsector  
Erase (SSE) for further details.  
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