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MT41J256M4 参数 Datasheet PDF下载

MT41J256M4图片预览
型号: MT41J256M4
PDF下载: 下载PDF文件 查看货源
内容描述: DDR3 SDRAM MT41J256M4 â ????梅格32 ×4× 8银行MT41J128M8 â ????梅格16 ×8× 8银行MT41J64M16 â ???? 8梅格×16× 8银行 [DDR3 SDRAM MT41J256M4 – 32 Meg x 4 x 8 banks MT41J128M8 – 16 Meg x 8 x 8 banks MT41J64M16 – 8 Meg x 16 x 8 banks]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 214 页 / 2938 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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1Gb: x4, x8, x16 DDR3 SDRAM  
Electrical Characteristics and AC Operating Conditions  
tREFPDEN (MIN) is satisfied, there are cases where additional time such as tXPDLL (MIN)  
is required.  
38. ODT turn-on time MIN is when the device leaves High-Z and ODT resistance begins to  
turn on. ODT turn-on time maximum is when the ODT resistance is fully on. The ODT  
reference load is shown in Figure 23 (page 57). Designs that were created prior to JEDEC  
tightening the maximum limit from 9ns to 8.5ns will be allowed to have a 9ns maxi-  
mum.  
39. Half-clock output parameters must be derated by the actual tERR10per and tJITdty when  
input clock jitter is present. This results in each parameter becoming larger. The parame-  
ters tADC (MIN) and tAOF (MIN) are each required to be derated by subtracting both  
tERR10per (MAX) and tJITdty (MAX). The parameters tADC (MAX) and tAOF (MAX) are  
required to be derated by subtracting both tERR10per (MAX) and tJITdty (MAX).  
40. ODT turn-off time minimum is when the device starts to turn off ODT resistance. ODT  
turn-off time maximum is when the DRAM buffer is in High-Z. The ODT reference load is  
shown in Figure 24 (page 60). This output load is used for ODT timings (see Figure 31  
(page 71)).  
41. Pulse width of a input signal is defined as the width between the first crossing of  
VREF(DC) and the consecutive crossing of VREF(DC).  
42. Should the clock rate be larger than tRFC (MIN), an AUTO REFRESH command should  
have at least one NOP command between it and another AUTO REFRESH command. Ad-  
ditionally, if the clock rate is slower than 40ns (25 MHz), all REFRESH commands should  
be followed by a PRECHARGE ALL command.  
43. DRAM devices should be evenly addressed when being accessed. Disproportionate ac-  
cesses to a particular row address may result in a reduction of REFRESH characteristics or  
product lifetime.  
44. When two VIH(AC) values (and two corresponding VIL(AC) values) are listed for a specific  
speed bin, the user may choose either value for the input AC level. Whichever value is  
used, the associated setup time for that AC level must also be used. Additionally, one  
VIH(AC) value may be used for address/command inputs and the other VIH(AC) value may  
be used for data inputs.  
For example, for DDR3-800, two input AC levels are defined: VIH(AC175),min and  
V
IH(AC150),min (corresponding VIL(AC175),min and VIL(AC150),min). For DDR3-800, the address/  
command inputs must use either VIH(AC175),min with tIS(AC175) of 200ps or VIH(AC150),min  
with tIS(AC150) of 350ps; independently, the data inputs must use either VIH(AC175),min  
with tDS(AC175) of 75ps or VIH(AC150),min with tDS(AC150) of 125ps.  
PDF: 09005aef826aa906  
1Gb_DDR3_SDRAM.pdf - Rev. L 03/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
88  
‹ 2006 Micron Technology, Inc. All rights reserved.  
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