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MT41J256M4 参数 Datasheet PDF下载

MT41J256M4图片预览
型号: MT41J256M4
PDF下载: 下载PDF文件 查看货源
内容描述: DDR3 SDRAM MT41J256M4 â ????梅格32 ×4× 8银行MT41J128M8 â ????梅格16 ×8× 8银行MT41J64M16 â ???? 8梅格×16× 8银行 [DDR3 SDRAM MT41J256M4 – 32 Meg x 4 x 8 banks MT41J128M8 – 16 Meg x 8 x 8 banks MT41J64M16 – 8 Meg x 16 x 8 banks]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 214 页 / 2938 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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1Gb: x4, x8, x16 DDR3 SDRAM  
WRITE Operation  
Figure 94: WRITE (BC4 OTF) to PRECHARGE  
T0  
T1  
T2  
T3  
T4  
T5  
T6  
T7  
T8  
T9  
Tn  
CK#  
CK  
1
WRITE  
NOP  
NOP  
NOP  
NOP  
NOP  
NOP  
NOP  
NOP  
NOP  
PRE  
Command  
tWR2  
Bank,  
Col n  
3
Valid  
Address  
tWPRE  
tWPST  
DQS, DQS#  
DI  
n
DI  
DI  
DI  
n + 3  
4
DQ  
n + 1  
n + 2  
WL = 5  
Indicates break  
in time scale  
Transitioning Data  
Don’t Care  
1. NOP commands are shown for ease of illustration; other commands may be valid at  
these times.  
Notes:  
2. The write recovery time (tWR) is referenced from the rising clock edge at T9. tWR speci-  
fies the last burst WRITE cycle until the PRECHARGE command can be issued to the same  
bank.  
3. The BC4 setting is activated by MR0[1:0] = 01 and A12 = 0 during the WRITE command  
at T0.  
4. DI n = data-in for column n.  
5. BC4 (OTF), WL = 5, RL = 5.  
DQ Input Timing  
Figure 85 (page 102) shows the strobe-to-clock timing during a WRITE burst. DQS,  
DQS# must transition within ±.25tCK of the clock transitions, as limited by tDQSS. All  
data and data mask setup and hold timings are measured relative to the DQS, DQS#  
crossing, not the clock crossing.  
The WRITE preamble and postamble are also shown in Figure 85 (page 102). One clock  
prior to data input to the DRAM, DQS must be HIGH and DQS# must be LOW. Then for  
a half clock, DQS is driven LOW (DQS# is driven HIGH) during the WRITE preamble,  
tWPRE. Likewise, DQS must be kept LOW by the controller after the last data is written  
t
to the DRAM during the WRITE postamble, WPST.  
Data setup and hold times are also shown in Figure 85 (page 102). All setup and hold  
times are measured from the crossing points of DQS and DQS#. These setup and hold  
values pertain to data input and data mask input.  
Additionally, the half period of the data input strobe is specified by tDQSH and tDQSL.  
PDF: 09005aef826aa906  
1Gb_DDR3_SDRAM.pdf - Rev. L 03/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
178  
‹ 2006 Micron Technology, Inc. All rights reserved.  
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