欢迎访问ic37.com |
会员登录 免费注册
发布采购

JS28F256P30B 参数 Datasheet PDF下载

JS28F256P30B图片预览
型号: JS28F256P30B
PDF下载: 下载PDF文件 查看货源
内容描述: 美光并行NOR闪存的嵌入式存储器( P30-65nm ) [Micron Parallel NOR Flash Embedded Memory (P30-65nm)]
分类和应用: 闪存存储
文件页数/大小: 98 页 / 1366 K
品牌: MICRON [ MICRON TECHNOLOGY ]
 浏览型号JS28F256P30B的Datasheet PDF文件第78页浏览型号JS28F256P30B的Datasheet PDF文件第79页浏览型号JS28F256P30B的Datasheet PDF文件第80页浏览型号JS28F256P30B的Datasheet PDF文件第81页浏览型号JS28F256P30B的Datasheet PDF文件第83页浏览型号JS28F256P30B的Datasheet PDF文件第84页浏览型号JS28F256P30B的Datasheet PDF文件第85页浏览型号JS28F256P30B的Datasheet PDF文件第86页  
256Mb and 512Mb (256Mb/256Mb), P30-65nm  
AC Test Conditions and Capacitance  
AC Test Conditions and Capacitance  
Figure 27: AC Input/Output Reference Timing  
VCCQ  
Input V  
/2  
Test points  
V
/2 output  
CCQ  
CCQ  
0V  
1. AC test inputs are driven at VCCQ for logic 1 and at 0V for logic 0. Input/output timing  
begins/ends at VCCQ/2. Input rise and fall times (10% to 90%) <5ns. Worst-case speed oc-  
curs at VCC = VCC (MIN).  
Note:  
Figure 28: Transient Equivalent Load Circuit  
Device under  
test  
Out  
C
L
1. See the Test Configuration for Worst-Case Speed Conditions table for component values.  
2. CL includes jig capacitance.  
Notes:  
Table 42: Test Configuration: Worst-Case Speed Condition  
Test Configuration  
CL (pF)  
VCCQ(MIN) standard test  
30  
Figure 29: Clock Input AC Waveform  
tCLK  
VIH  
CLK  
VIL  
tCH/CL  
tFCLK/RCLK  
PDF: 09005aef84566799  
p30_65nm_MLC_256Mb-512mb.pdf - Rev. C 12/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
82  
© 2013 Micron Technology, Inc. All rights reserved.