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JS28F256P30B 参数 Datasheet PDF下载

JS28F256P30B图片预览
型号: JS28F256P30B
PDF下载: 下载PDF文件 查看货源
内容描述: 美光并行NOR闪存的嵌入式存储器( P30-65nm ) [Micron Parallel NOR Flash Embedded Memory (P30-65nm)]
分类和应用: 闪存存储
文件页数/大小: 98 页 / 1366 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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256Mb and 512Mb (256Mb/256Mb), P30-65nm  
Signal Descriptions  
Table 8: QUAD+ SCSP Signal Descriptions (Continued)  
Symbol  
Type  
Name and Function  
RST#  
Input  
Reset: Active LOW input. RST# resets internal automation and inhibits WRITE operations.  
This provides data protection during power transitions. RST# HIGH enables normal opera-  
tion. Exit from reset places the device in asynchronous read array mode.  
WE#  
WP#  
Input  
Input  
Write enable: Active LOW input. WE# controls writes to the device. Address and data are  
latched on the rising edge of WE# or CE#, whichever occurs first.  
Write protect: Active LOW input. WP# LOW enables the lock-down mechanism. Blocks in  
lock-down cannot be unlocked with the UNLOCK command. WP# HIGH overrides the lock-  
down function enabling blocks to be erased or programmed using software commands.  
Note: Designs not using WP# for protection could tie it to VCCQ or VSS without additional  
capacitor.  
VPP  
Power/lnput Erase and program power: A valid voltage on this pin allows erasing or programming.  
Memory contents cannot be altered when VPP VPPLK. Block erase and program at invalid  
VPP voltages should not be attempted.  
Set VPP = VPPL for in-system PROGRAM and ERASE operations. To accommodate resistor or  
diode drops from the system supply, the VIH level of VPP can be as low as VPPL,min . VPP must  
remain above VPPL,min to perform in-system flash modification. VPP may be 0V during READ  
operations.  
VPPH can be applied to main blocks for 1000 cycles maximum and to parameter blocks for  
2500 cycles. VPP can be connected to 9V for a cumulative total not to exceed 80 hours. Ex-  
tended use of this pin at 9V may reduce block cycling capability.  
DQ[15:0]  
WAIT  
Input/Output Data input/output: Inputs data and commands during WRITE cycles; outputs data during  
memory, status register, protection register, and read configuration register reads. Data  
balls float when the CE# or OE# are de-asserted. Data is internally latched during writes.  
Output  
Wait: Indicates data valid in synchronous array or non-array burst reads. Read configura-  
tion register bit 10 (RCR.10, WT) determines its polarity when asserted. The active output is  
VOL or VOH when CE# and OE# are VIL. WAIT is High-Z if CE# or OE# is VIH.  
• In synchronous array or non-array read modes, WAIT indicates invalid data when asser-  
ted and valid data when de-asserted.  
• In asynchronous page mode, and all write modes, WAIT is de-asserted.  
VCC  
Power  
Device core power supply: Core (logic) source voltage. Writes to the array are inhibited  
when VCC VLKO. Operations at invalid VCC voltages should not be attempted.  
VCCQ  
VSS  
Power  
Power  
Output power supply: Output driver source voltage.  
Ground: Connect to system ground. Do not float any VSS connection.  
RFU  
Reserved for future use: Reserved by Micron for future device functionality and en-  
hancement. These should be treated in the same way as a DU signal.  
DU  
NC  
Do not use: Do not connect to any other signal, or power supply; must be left floating.  
No connect: No internal connection; can be driven or floated.  
PDF: 09005aef84566799  
p30_65nm_MLC_256Mb-512mb.pdf - Rev. C 12/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
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© 2013 Micron Technology, Inc. All rights reserved.  
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