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JS28F256P30TFE 参数 Datasheet PDF下载

JS28F256P30TFE图片预览
型号: JS28F256P30TFE
PDF下载: 下载PDF文件 查看货源
内容描述: 256MB和512MB (256 / 256MB ) , P30-65nm [256Mb and 512Mb (256Mb/256Mb), P30-65nm]
分类和应用:
文件页数/大小: 95 页 / 1351 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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256Mb and 512Mb (256Mb/256Mb), P30-65nm  
Program and Erase Characteristics  
Program and Erase Characteristics  
Table 47: Program and Erase Specifications  
VPPL  
VPPH  
Number  
Symbol Parameter  
Min  
Typ Max Min  
Typ Max Unit  
Notes  
Conventional Word Programming  
W200  
tPROG/W  
Program Single word  
Time  
-
270  
456  
-
270  
456  
µs  
µs  
1
Buffered Programming  
W250 tPROG  
Program Aligned 32-Word, BP  
-
-
-
-
-
310  
310  
716  
900  
-
-
-
-
-
310  
310  
716  
900  
1
Time  
time (32 words)  
Aligned 64-Wd, BP  
time (64 words)  
Aligned 128-Wd, BP  
time (128 words)  
375 1140  
505 1690  
900 3016  
375 1140  
505 1690  
900 3016  
Aligned 256-Wd, BP  
time (256 words)  
one full buffer, BP  
time (512 words)  
Buffered Enhanced Factory Programming  
W451  
W452  
tBEFP/B  
Program Single byte  
BEFP Setup  
n/a  
n/a  
n/a  
n/a  
n/a  
n/a  
-
0.5  
-
-
-
µs  
1, 2  
1
tBEFP/Setup  
5
Erase and Suspend  
W500  
W501  
tERS/PB  
tERS/MB  
tSUSP/P  
Erase  
Time  
32-KByte Parameter  
128-KByte Main  
-
-
-
-
-
0.8  
0.8  
25  
4.0  
4.0  
30  
30  
-
-
-
-
-
-
0.8  
0.8  
25  
4.0  
4.0  
30  
30  
-
s
1
W600  
Suspend Program suspend  
Latency  
µs  
W601  
tSUSP/E  
Erase suspend  
25  
25  
W602  
tERS/SUSP  
Erase to Suspend  
500  
500  
1, 3  
Blank Check  
W702  
tBC/MB  
blank  
check  
Main Array Block  
-
3.2  
-
-
3.2  
-
ms  
1. Typical values measured at TC = +25 °C and nominal voltages. Performance numbers are  
valid for all speed versions. Excludes system overhead. Sampled, but not 100% tested.  
Notes:  
2. Averaged over entire device.  
3. W602 is the typical time between an initial block erase or erase resume command and  
the a subsequent erase suspend command. Violating the specification repeatedly during  
any particular block erase may cause erase failures.  
PDF: 09005aef84566799  
p30_65nm_256Mb-512mb.pdf - Rev. A 1/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
94  
© 2013 Micron Technology, Inc. All rights reserved.