ABSOLUTE MAXIMUM RATINGS
OPERATING RANGES
Storage Temperature . . . . . . . . . . . –65°C to +150°C
Commercial (C) Devices
Ambient Temperature
with Power Applied . . . . . . . . . . . . . –55°C to +125°C
Temperature (TA) Operating
in Free Air . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C
Supply Voltage with
Respect to Ground . . . . . . . . . . . . . –0.5 V to +7.0 V
Supply Voltage (VCC) with
Respect to Ground . . . . . . . . . . . . +4.75 V to +5.25 V
DC Input Voltage . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC Output or I/O
Pin Voltage . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current
(TA = 0°C to +70°C) . . . . . . . . . . . . . . . . . . . . 200 mA
Stressesabove those listed under Absolute MaximumRatings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified
Parameter
Symbol
Parameter Description
Test Conditions
Min
Typ
Max
Unit
VOH
Output HIGH Voltage
IOH = –3.2 mA, VCC = Min
2.4
V
V
IN = VIH or VIL
IOL = 24 mA, VCC = Min
IN = VIH or VIL (Note 1)
VOL
VIH
VIL
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
0.5
V
V
V
V
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 2)
2.0
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 2)
0.8
IIH
IIL
Input HIGH Current
Input LOW Current
VIN = 5.25 V, VCC = Max (Note 3)
VIN = 0 V, VCC = Max (Note 3)
VOUT = 5.25 V, VCC = Max
10
–100
10
µA
µA
µA
IOZH
Off-State Output Leakage
Current HIGH
V
IN = VIH or VIL (Note 3)
VOUT = 0 V, VCC = Max
IN = VIH or VIL (Note 3)
IOZL
Off-State Output Leakage
Current LOW
–100
–160
µA
V
ISC
ICC
Output Short-Circuit Current
Supply Current (Typical)
VOUT = 0.5 V, VCC = Max (Note 4)
–30
mA
mA
VCC = 5 V, TA = 25°C, f = 25 MHz
95
(Note 5)
Notes:
1. Total IOL for one PAL block should not exceed 128 mA.
2. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
3. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
4. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
5. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and is capable of being
loaded, enabled, and reset.
12
MACH215-12/15/20 (Com’l)
LATTICE [ LATTICE SEMICONDUCTOR ]
