Architecture
LatticeECP/EC Family Data Sheet
Lattice Semiconductor
Table 2-14. Supported Output Standards
Output Standard
Single-ended Interfaces
LVTTL
Drive
V
(Nom.)
CCIO
4mA, 8mA, 12mA, 16mA, 20mA
3.3
LVCMOS33
4mA, 8mA, 12mA 16mA, 20mA
3.3
2.5
1.8
1.5
1.2
—
LVCMOS25
4mA, 8mA, 12mA, 16mA, 20mA
LVCMOS18
4mA, 8mA, 12mA, 16mA
LVCMOS15
4mA, 8mA
LVCMOS12
2mA, 6mA
LVCMOS33, Open Drain
LVCMOS25, Open Drain
LVCMOS18, Open Drain
LVCMOS15, Open Drain
LVCMOS12, Open Drain
PCI33
4mA, 8mA, 12mA 16mA, 20mA
4mA, 8mA, 12mA 16mA, 20mA
—
4mA, 8mA, 12mA 16mA
—
4mA, 8mA
2mA, 6mA
N/A
—
—
3.3
1.8
1.5
3.3
2.5
1.8
HSTL18 Class I, II, III
HSTL15 Class I, III
SSTL3 Class I, II
N/A
N/A
N/A
SSTL2 Class I, II
N/A
SSTL18 Class I
N/A
Differential Interfaces
Differential SSTL3, Class I, II
Differential SSTL2, Class I, II
Differential SSTL18, Class I
Differential HSTL18, Class I, II, III
Differential HSTL15, Class I, III
LVDS
BLVDS1
LVPECL1
RSDS1
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
3.3
2.5
1.8
1.8
1.5
2.5
2.5
3.3
2.5
1. Emulated with external resistors.
Hot Socketing
The LatticeECP/EC devices have been carefully designed to ensure predictable behavior during power-up and
power-down. Power supplies can be sequenced in any order. During power up and power-down sequences, the
I/Os remain in tristate until the power supply voltage is high enough to ensure reliable operation. In addition,
leakage into I/O pins is controlled within specified limits, this allows for easy integration with the rest of the sys-
tem. These capabilities make the LatticeECP/EC ideal for many multiple power supply and hot-swap applica-
tions.
Configuration and Testing
The following section describes the configuration and testing features of the LatticeECP/EC devices.
IEEE 1149.1-Compliant Boundary Scan Testability
All LatticeECP/EC devices have boundary scan cells that are accessed through an IEEE 1149.1 compliant test
access port (TAP). This allows functional testing of the circuit board, on which the device is mounted, through a
serial scan path that can access all critical logic nodes. Internal registers are linked internally, allowing test data to
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LATTICE [ LATTICE SEMICONDUCTOR ]
