Lattice Semiconductor
ispMACH 4000V/B/C/Z Family Data Sheet
Switching Test Conditions
Figure 12 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 11.
Figure 12. Output Test Load, LVTTL and LVCMOS Standards
V
CCO
R
1
2
Test
Point
DUT
R
C
L
0213A/ispm4k
Table 11. Test Fixture Required Components
1
Test Condition
R
R
C
Timing Ref.
V
CCO
1
2
L
LVCMOS 3.3 = 1.5V
LVCMOS 3.3 = 3.0V
LVCMOS I/O, (L -> H, H -> L)
106Ω 106Ω
35pF
LVCMOS 2.5 = V
LVCMOS 1.8 = V
1.5V
/2
/2
LVCMOS 2.5 = 2.3V
CCO
CCO
LVCMOS 1.8 = 1.65V
LVCMOS I/O (Z -> H)
LVCMOS I/O (Z -> L)
LVCMOS I/O (H -> Z)
LVCMOS I/O (L -> Z)
∞
106Ω
∞
35pF
35pF
5pF
3.0V
3.0V
3.0V
3.0V
106Ω
∞
1.5V
106Ω
∞
V
V
- 0.3
OH
OL
106Ω
5pF
+ 0.3
1. C includes test fixtures and probe capacitance.
L
41
LATTICE [ LATTICE SEMICONDUCTOR ]
