Specifications ispLSI 8600V
Switching Test Conditions
Figure 9. Test Load
Input Pulse Levels
GND to VCCIOmin
≤ 1.5 ns 10% to 90%
1.5V
V
Input Rise and Fall Time
Input Timing Reference Levels
Ouput Timing Reference Levels
Output Load
CCIO
1.5V
R
1
See Figure 9
Device
Output
Test
Point
Table 2-0003/8600V
3-state levels are measured 0.5V from
steady-state active level.
R
C
*
2
L
Output Load Conditions (See Figure 9)
3.3V
R1
316Ω 348Ω 511Ω 475Ω
2.5V
TEST CONDITION
R2
R1 R2
CL
*
C includes Test Fixture and Probe Capacitance.
L
A
35pF
35pF
35pF
0213A/8600V
Active High
Active Low
348Ω
475Ω
∞
∞
B
316Ω
∞
511Ω
∞
Active High to Z
at VOH -0.5V
348Ω
475Ω
∞
∞
5pF
C
D
Active Low to Z
316Ω
∞
∞
511Ω
∞
∞
5pF
at VOL+0.5V
Slow Slew
∞
∞
35pF
Table 2-0004A/8600V
DC Electrical Characteristics for 3.3V Range
Over Recommended Operating Conditions
SYMBOL
PARAMETER
CONDITION
TA = 0°C to + 70°C
MIN. MAX. UNITS
I/O Supply Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
3.0
-0.3
2.0
–
3.6
0.8
5.25
0.4
–
V
V
V
V
V
V
V
V
V
V
CCIO
IL
IH
IOL = 8 mA
OL
OH
IOH = -4 mA
2.4
Table 2-0007/8600V
DC Electrical Characteristics for 2.5V Range
Over Recommended Operating Conditions
SYMBOL
PARAMETER
I/O Supply Voltage
CONDITION
TA = 0°C to + 70°C
MIN. MAX. UNITS
2.3
2.7
0.7
V
V
V
V
V
CCIO
Input Low Voltage
Input High Voltage
-0.3
IL
1.7
–
5.25
0.2
0.7
–
V
V
V
V
V
IH
VCCIO=min, VIN=VIH or VIL, IOL= 100µA
Output Low Voltage
Output High Voltage
VOL
VCCIO=min, VIN=VIH or VIL, IOL= 2mA
VCCIO=min, VIN=VIH or VIL, IOH= -100µA
VCCIO=min, VIN=VIH or VIL, IOH= -2mA
–
2.1
1.7
VOH
–
Table 2-0007B/8600V
12
LATTICE [ LATTICE SEMICONDUCTOR ]
