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TE28F008S5-100 参数 Datasheet PDF下载

TE28F008S5-100图片预览
型号: TE28F008S5-100
PDF下载: 下载PDF文件 查看货源
内容描述: 字节宽的SMART 5 FlashFile Memory系列4 ,8和16 MBIT [BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT]
分类和应用: 闪存存储内存集成电路光电二极管
文件页数/大小: 37 页 / 505 K
品牌: INTEL [ INTEL ]
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BYTE-WIDE SMART 5 FlashFile™ MEMORY FAMILY  
E
6.2.6  
COMMERCIAL TEMPERATURE AC CHARACTERISTICS - WRITE OPERATIONS(1,2)  
Commercial Temperature Write Operations for  
4-, 8-, and 16-Mbit Smart 5 FlashFile™ Memories at TA = 0°C to +70°C  
5V ± 5%,  
5V ± 10% VCC  
Valid for All  
Speeds  
Versions(4)  
Unit  
#
W1 tPHWL (tPHEL  
W2 tELWL (tWLEL  
W3 tWP  
W4 tDVWH (tDVEH  
W5 tAVWH (tAVEH  
W6 tWHEH (tEHWH  
W7 tWHDX (tEHDX  
W8 tWHAX (tEHAX  
W9 tWPH  
W10 tPHHWH (tPHHEH  
W11 tVPWH (tVPEH  
W12 tWHGL (tEHGL  
Sym  
Parameter  
Notes Min Max  
)
RP# High Recovery to WE# (CE#) Going Low  
CE# (WE#) Setup to WE# (CE#) Going Low  
Write Pulse Width  
3
7
7
4
4
1
0
µs  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
)
50  
40  
40  
0
)
Data Setup to WE# (CE#) Going High  
Address Setup to WE# (CE#) Going High  
CE# (WE#) Hold from WE# (CE#) High  
Data Hold from WE# (CE#) High  
)
)
)
5
)
Address Hold from WE# (CE#) High  
Write Pulse Width High  
5
8
3
3
25  
100  
100  
0
)
RP# VHH Setup to WE# (CE#) Going High  
VPP Setup to WE# (CE#) Going High  
Write Recovery before Read  
)
)
W13 tWHRL (tEHRL  
)
WE# (CE#) High to RY/BY# Going Low  
RP# VHH Hold from Valid SRD, RY/BY# High  
VPP Hold from Valid SRD, RY/BY# High  
90  
W14 tQVPH  
3,5  
3,5  
0
0
W15 tQVVL  
NOTES:  
1. Read timing characteristics during block erase, program, and lock-bit configuration operations are the same as during  
read-only operations. Refer to AC Characteristics for read-only operations.  
2. A write operation can be initiated and terminated with either CE# or WE#.  
3. Sampled, not 100% tested.  
4. Refer to Table 3 for valid AIN and DIN for block erase, program, or lock-bit configuration.  
5.  
V
PP should be held at VPPH1/2 (and if necessary RP# should be held at VHH) until determination of block erase, program, or  
lock-bit configuration success (SR.1/3/4/5 = 0).  
6. See Ordering Information for device speeds (valid operational combinations).  
7. Write pulse width (tWP) is defined from CE# or WE# going low (whichever goes low last) to CE# or WE# going high  
(whichever goes high first). Hence, tWP = tWLWH = tELEH = tWLEH = tELWH. If CE# is driven low 10 ns before WE# going low,  
WE# pulse width requirement decreases to tWP - 20 ns.  
8. Write pulse width high (tWPH) is defined from CE# or WE# going high (whichever goes high first) to CE# or WE# going low  
(whichever goes low last). Hence, tWPH = tWHWL = tEHEL = tWHEL = tEHWL  
.
32  
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