BYTE-WIDE SMART 5 FlashFile™ MEMORY FAMILY
E
6.2.4
COMMERCIAL TEMPERATURE AC CHARACTERISTICS - READ-ONLY OPERATIONS(1)
Commercial Temperature Read-Only Operations for
4-, 8-, and 16-Mbit Smart 5 FlashFile™ Memories at TA = 0°C to +70°C
5V ± 5% VCC
5V ± 10% VCC
–85/–95(5)
Versions(4)
–90/–100(6)
–120(6)
#
Sym
Parameter
Read Cycle Time
Notes Min Max Min Max Min Max Unit
R1 tAVAV
4, 8 Mbit
16 Mbit
4, 8 Mbit
16 Mbit
85
95
90
120
120
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
100
R2 tAVQV Address to Output
Delay
85
95
90
100
90
120
120
120
120
50
R3 tELQV
CE# to Output Delay 4, 8 Mbit
16 Mbit
2
2
2
85
95
100
45
R4 tGLQV OE# to Output Delay
40
R5 tPHQV RP# High to Output Delay
400
400
400
R6 tELQX
CE# to Output in Low Z
3
3
3
3
3
0
0
0
0
0
0
R7 tGLQX OE# to Output in Low Z
R8 tEHQZ CE# High to Output in High Z
R9 tGHQZ OE# High to Output in High Z
55
10
55
10
55
15
R10 tOH
Output Hold from Address, CE#
or OE# Change, Whichever
Occurs First
0
0
0
NOTES:
1. See AC Input/Output Reference Waveform for maximum allowable input slew rate.
2. OE# may be delayed up to tELQV-tGLQV after the falling edge of CE# without impact on tELQV
.
3. Sampled, not 100% tested.
4. See Ordering Information for device speeds (valid operational combinations).
5. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed
Configuration) for testing characteristics.
6. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard Configuration)
for testing characteristics.
30
PRODUCT PREVIEW
INTEL [ INTEL ]
