28F020
4.6
E
DC Characteristics—TTL/NMOS Compatible—Extended Temperature
Products (Continued)
Limits
Typ(3)
Symbol
VID
Parameter
Notes
Min
Max
Unit
Test Conditions
A9 Intelligent
Identifier
11.50
13.0
0
V
Voltage
IID
A9 Intelligent
Identifier
Current
1, 2
90
500
µA
V
A9 = VID
VPPL
VPP during
Read-Only
Operations
0.00
6.5
NOTE:
Erase/Program
are Inhibited
when VPP = VPPL
VPPH
VPP during
Read/Write
Operations
11.40
2.5
12.60
V
V
VLKO
VCC
Erase/Write
Lock Voltage
4.7
DC Characteristics—CMOS Compatible—Extended Temperature Products
Limits
Symbol
Parameter
Notes
Min
Typ(3)
Max
Unit
Test Conditions
ILI
Input Leakage
Current
1
±1.0
µA
VCC = VCC Max
V
IN = VCC or VSS
ILO
Output Leakage
Current
1
±10
µA
VCC = VCC Max
V
OUT = VCC or
VSS
ICCS
ICC1
VCC Standby
Current
1
1
50
10
100
50
µA
VCC = VCC Max
CE# = VCC ±0.2 V
VCC Active Read
Current
mA
VCC = VCC Max
CE# = VIL
f = 6 MHz
I
OUT = 0 mA
ICC2
VCC
Programming
Current
1, 2
1, 2
1.0
5.0
10
30
mA
mA
Programming in
Progress
ICC3
VCC Erase
Current
Erasure in
Progress
24