E
28F020
3.0
0.0
2.4
2.0
0.8
2.0
Output
0.8
Input
1.5
Test Points
1.5 Output
Input
0.45
Test Points
0245_08
0245_06
AC test inputs are driven at 3.0 V for a Logic “1” and 0.0 V
for a Logic “0.” Input timing begins, and output timing ends,
at 1.5 V. Input rise and fall times (10% to 90%) <10 ns.
AC test inputs are driven at VOH (2.4 VTTL) for a Logic “1”
and VOL (0.45 VTTL) for a Logic “0.” Input timing begins at
VIH (2.0 VTTL) and VIL (0.8 VTTL). Output timing ends at V
IH
and VIL. Input rise and fall times (10% to 90%) <10 ns.
Figure 8. High Speed AC Testing Input/Output
Waveforms(2)
Figure 6. Testing Input/Output Waveform(1)
1.3V
1.3V
1N914
1N914
RL = 3.3 k
Ω
RL = 3.3 kΩ
Device
Under Test
Device
Under Test
Out
Out
CL = 100 pF
CL = 30 pF
0245_07
0245_09
CL Includes Jig Capacitance
CL Includes Jig Capacitance
Figure 7. AC Testing Load Circuit(1)
Figure 9. High Speed AC Testing Load Circuit(2)
NOTES:
1. Testing characteristics for 28F020-70 in standard configuration, and 28F020-90 and 28F020-150.
2. Testing characteristics for 28F020-70 in high speed configuration.
27
INTEL [ INTEL ]
