28F020
4.8
E
AC Characteristics—Read Only Operations—Commercial and Extended
Temperature Products
Versions
28F020-90(4)
28F020-120(4)
28F020-150(4)
Symbol
Characteristics
Notes
Min
Max
Min
Max
Min
Max
Unit
tAVAV/tRC Read Cycle Time
90
120
150
ns
tELQV
/
Chip Enable Access
Time
90
90
35
120
120
50
150
150
50
ns
tCE>
tAVQV
tACC
/
Address Access
Time
ns
ns
ns
ns
ns
ns
ns
tGLQV
tOE
/
Output Enable
Access Time
tELQX
/
Chip Enable to
Output in Low Z
2, 3
2
0
0
0
0
0
0
tLZ
tEHQZ
Chip Disable to
Output in High Z
45
30
55
30
55
30
tGLQX
tOLZ
/
Output Enable to
Output in Low Z
2, 3
2
tGHQZ
tDF
/
Output Disable to
Output in High Z
tOH
Output Hold from
Address, CE#, or
OE# Change
1, 2
0
6
0
6
0
6
tWHGL
Write Recovery Time
before Read
µs
NOTES:
1. Whichever occurs first.
2. Sampled, not 100% tested.
3. Guaranteed by design.
4. See High Speed AC Testing Input/Output Waveform (Figure 8) and High Speed AC Testing Load Circuit (Figure 9) for
testing characteristics.
5. See Testing Input/Output Waveform (Figure 6) and AC Testing Load Circuit (Figure 7) for testing characteristics.
28
INTEL [ INTEL ]
