28F020
4.5
E
DC Characteristics—CMOS Compatible—Commercial Products (Continued)
Limits
Symbol
Parameter
Notes
Min
Typ(3)
Max
Unit
Test Conditions
VOH1
VOH2
VID
Output High
Voltage
0.85
VCC
V
VCC = VCC Min
I
OH = –2.5 mA
VCC
0.4
–
VCC = VCC Min
OH = –100 µA
I
A9 Intelligent
Identifier Voltage
11.50
13.00
200
V
µA
V
IID
A9 Intelligent
Identifier Current
1, 2
90
A9 = VID
VPPL
VPP during
Read-Only
Operations
0.00
6.5
NOTE:
Erase/Programs
are Inhibited when
V
PP = VPPL
VPPH
VPP during
Read/Write
Operations
11.40
2.5
12.60
V
V
VLKO
VCC Erase/Write
Lock Voltage
4.6
DC Characteristics—TTL/NMOS Compatible—Extended Temperature
Products
Limits
Symbol
Parameter
Notes
Min
Typ(3)
Max
Unit
Test Conditions
ILI
Input Leakage
Current
1
±1.0
µA
VCC = VCC Max
V
IN = VCC or VSS
ILO
Output Leakage
Current
1
±10
µA
VCC= VCC Max
V
OUT = VCC or
VSS
ICCS
ICC1
VCC Standby
Current
1
1
0.3
10
1.0
30
mA
mA
VCC = VCC Max
CE# = VIH
VCC Active Read
Current
VCC = VCC Max
CE# = VIL
f = 6 MHz
I
OUT = 0 mA
ICC2
VCC
Programming
Current
1, 2
1.0
30
mA
Programming in
Progress
22
INTEL [ INTEL ]
