欢迎访问ic37.com |
会员登录 免费注册
发布采购

313072-002 参数 Datasheet PDF下载

313072-002图片预览
型号: 313072-002
PDF下载: 下载PDF文件 查看货源
内容描述: 高级内存缓冲器 [Advanced Memory Buffer]
分类和应用:
文件页数/大小: 250 页 / 3863 K
品牌: INTEL [ INTEL ]
 浏览型号313072-002的Datasheet PDF文件第122页浏览型号313072-002的Datasheet PDF文件第123页浏览型号313072-002的Datasheet PDF文件第124页浏览型号313072-002的Datasheet PDF文件第125页浏览型号313072-002的Datasheet PDF文件第127页浏览型号313072-002的Datasheet PDF文件第128页浏览型号313072-002的Datasheet PDF文件第129页浏览型号313072-002的Datasheet PDF文件第130页  
DDR MemBIST  
Table 11-7. Example of LFSR Random Data  
Mbdata9  
xxL[71:64  
]E[71:64]  
Mbdata7  
L[63:32]  
Mbdata6  
L[31:0]  
Mbdata5  
E[63:32]  
Mbdata4  
E[31:0]  
Early  
CB  
Late  
CB  
#
Early DQ  
Late DQ  
1
2
3
4
5
27fe_3b3d  
0
0
0
0
0
0
0
0
0
0
4e2e_350c 4ffc_767a  
C9a8_9bae 9c5c_6a18 9ff8_ecf4  
97ca_9c36 9351_375d 38b8_d431 3ff1_d9e9  
662f_8edd 2f95_386d 26a2_6ebb 7171_a862 7fe3_b3d2  
4031_1dd0 cc5f_1dba 5f2a_70da 4d44_dd76 e2e3_50c4  
dd  
d0  
8e  
1d  
7171_a862  
_7fe3_b3d2  
2f95_386d  
_26a2_6ebb  
6
4d44_dd76  
cc5f_1dba  
_ e2e3_50c4  
_5f2a_70da  
In the example shown, MBLFSRSED contains 0x93d7_8768 when MemBIST execution  
starts. MBCSR contains 0x8011_0b90. Lines 1 through 5 show filling of  
MBDATA[9,7:4] with random data generated by the CRC-32 block. For each line, newly  
generated random data is loaded into MBDATA9, and MBDATA[7:4] are loaded with  
data which is the result of a circular left shift from the register above it. Line 5 shows  
how 144 bits of the data from MBDATA[9,7:4] is sent on the CB and DQ pins when  
required by MemBIST. Line 6 shows the result of the circular shift of the contents of  
each MBDATA register into the next MBDATA register. Line 6 also shows how this  
second set of 144 bits of data will appear on the CB and DQ pins when it is used by  
MemBIST. The table shows how the random data from MBDATA9 is transferred from  
register to register each time that data is required by MemBIST execution, with a one-  
bit left circular shift occurring at each register transfer.  
11.3.4  
Algorithmic Testing  
MemBIST provides several of the more common algorithmic tests. Several of these are  
directed at basic operation such as initializing memory or verifying proper connectivity  
of the AMB and DRAM on a DIMM. In addition there are a few tests that are intended to  
perform testing of the AMB address generators and DRAM internal address decoders,  
multiplexers and related logic that is not otherwise testable at speed.  
The algorithm engine takes control of the MemBIST engine to carry out the algorithm  
steps. It does this by writing to some of the control bits in MBCSR. As a result, those  
control bits used by the algorithm engine are not available for setting by the user.  
However, the remaining control bits may be utilized by the user to control the  
algorithm. The MemBIST controls which may be selected by the user when using one  
of the built-in algorithms are:  
• Address sequencing (Fast X, Fast Y, Fast XY, and XZY)  
• Rank selection  
• Halt or continue on error  
When an algorithm is used, the data used for the test is always the fixed pattern 0xA.  
No other pattern may be chosen. The address space for the algorithm is always the  
address range specified by MB_START_ADDR and MB_END_ADDR. If testing of the full  
address range of the DRAM is required, then the MB_START_ADDR and MB_END_ADDR  
registers must be set to this address range.  
126  
Intel® 6400/6402 Advanced Memory Buffer Datasheet