iC-MH8
12 BIT ANGULAR HALL ENCODER
Rev A0.9, Page 10/25
OVERVIEW
Adr
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
Identification (0x78 bis 0x7B read-only)
0x78
0x79
0x7A
0x7B
0x7C
Device ID - 0x4D (’M’)
Device ID - 0x48 (’H’)
Revision - 0x38 (’8’)
Revision - 0x00 (”)
-
CFGTOS
0x7D
0x7E
0x7F
z
z
z
Manufacturer Revision - 0x00
Manufacturer ID - 0x00
Manufacturer ID - 0x00
z: Register value programmable by zapping
p: Register value write protected; can only be changed while V(VZAP)> Vt()hi
Table 5: Register layout
Hall signal processing . . . . . . . . . . . . . . . . . . . . Page 12 Sine/digital converter . . . . . . . . . . . . . . . . . . . . . Page 18
GAING:
GAINF:
Hall signal amplification range
Hall signal amplification (1–20, log.
scale)
Amplification calibration cosine
Activation of amplitude control
Offset calibration sine
Offset calibration cosine
Energy-saving mode
Calibration of bias current
Deactivation of NERR pull-up
Activation of high Hall clock pulse
Activation of noise filter
CFGRES:
CFGZPOS:
CFGAB:
CFGPOLE:
CFGSU:
CFGMTD:
CFGDIR:
CFGHYS:
CFGCOM:
Resolution of sine digital converter
Zero point for position
Configuration of incremental output
No. of poles for commutation signals
Behavior during start-up
GCC:
ENAC:
VOSS:
VOSC:
PRM:
CIBM:
DPU
HCLH
ENF
DAO:
Frequency at AB
Rotating direction reversal
Hysteresis sine/digital converter
Zero point for commutation
Test
TEST:
ENHC:
Test mode
Disable Analog Outputs
Enable High Current during ZAP-
Diode Read (iC-MH82 and later)
Activation of programming routine
RS422 driver . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Page 21
PROGZAP:
CFGDR:
TRIHL:
CFGO:
CFGPROT:
ENSSI:
Driver property
Tristate high-side/low-side driver
Configuration of output mode
Write/read protection memory
Activation of SSI mode