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IBM25403GCX-3JC66C2 参数 Datasheet PDF下载

IBM25403GCX-3JC66C2图片预览
型号: IBM25403GCX-3JC66C2
PDF下载: 下载PDF文件 查看货源
内容描述: [RISC Microprocessor, 32-Bit, 66MHz, CMOS, PQFP160, PLASTIC, QFP-160]
分类和应用: 时钟外围集成电路
文件页数/大小: 56 页 / 489 K
品牌: IBM [ IBM ]
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IBM PowerPC 403GCX  
Table 4. 403GCX Signal Descriptions  
Signal  
Name  
I/O  
Type  
Pin Ball1  
Function  
Reset  
91 K14 I/O  
Reset. A logic 0 input placed on this pin for one SysClk cycle causes  
the 403GCX to begin a system reset. When a system reset is  
invoked, the Reset pin becomes a logic 0 output for 2048 SysClk  
cycles.  
R/W  
127 C11 I/O  
Read / Write. When the 403GCX is bus master, R/W is an output  
which is high when data is read from memory and low when data is  
written to memory.  
When the 403GCX is not bus master, R/W is an input from the  
external bus master which indicates the direction of data transfer.  
SerClk  
26 J1  
I
Serial Port Clock. Through the Serial Port Clock Source bit in the  
Input/Output Configuration register (IOCR), users may choose the  
serial port clock source from either the input on the SerClk pin or  
processor SysClk. The maximum allowable input frequency into  
SerClk is half the SysClk frequency.  
SysClk  
TCK  
22 G3  
I
I
I
SysClk is the processor system clock input. The 403GCX can also  
be programmed to operate at a 2X internal clock rate while the  
external bus interface runs at the SysClk input rate.  
6
8
D2  
D1  
JTAG Test Clock Input. TCK is the clock source for the 403GCX test  
access port (TAP). The maximum clock rate into the TCK pin is one  
half of the processor SysClk clock rate.  
TDI  
Test Data In. The TDI is used to input serial data into the TAP. When  
the TAP enables the use of the TDI pin, the TDI pin is sampled on  
the rising edge of TCK and this data is input to the selected TAP  
shift register.  
TDO  
16 F3  
O
Test Data Output. TDO is used to transmit data from the 403GCX  
TAP. Data from the selected TAP shift register is shifted out on TDO.  
TestA  
TestB  
23 H1  
24 H2  
I
I
I
Reserved for manufacturing test. Tied low for normal operation.  
Reserved for manufacturing test. Tied high for normal operation.  
TestC/Hold- 37 M1  
Pri  
TestC. Reserved for manufacturing test during the reset interval.  
While Reset is active, this signal should be tied low for normal oper-  
ation.  
HoldReq Priority. When Reset is not active, this signal is sampled to  
determine the priority of the external bus master signal HoldReq. If  
HoldPri = 0 then the HoldReq signal is considered high priority, oth-  
erwise HoldReq is considered low priority.  
TestD  
38 M3  
25 H4  
I
I
Reserved for manufacturing test. Tied low for normal operation.  
TimerClk  
Timer Facility Clock. Through the Timer Clock Source bit in the  
Input/Output Configuration register (IOCR), users may choose the  
clock source for the Timer facility from either the input on the Timer-  
Clk pin or processor CoreClk. The maximum input frequency into  
TimerClk is half the CoreClk frequency.  
15  
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