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HY29F002TT-55 参数 Datasheet PDF下载

HY29F002TT-55图片预览
型号: HY29F002TT-55
PDF下载: 下载PDF文件 查看货源
内容描述: 2兆位( 256K ×8 ) , 5伏只,闪存 [2 Megabit (256K x 8), 5 Volt-only, Flash Memory]
分类和应用: 闪存
文件页数/大小: 38 页 / 381 K
品牌: HYNIX [ HYNIX SEMICONDUCTOR ]
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HY29F002T  
HY29F002T has separate chip enable (CE#), write  
enable (WE#) and output enable (OE#) controls.  
the device has a Sector Protect function which  
hardware write protects selected sectors. The  
sector protect and unprotect features can be en-  
abled in a PROM programmer. Temporary Sec-  
tor Unprotect, which requires a high voltage, al-  
lows in-system erasure and code changes in pre-  
viously protected sectors.  
The device is compatible with the JEDEC single  
power-supply Flash command set standard. Com-  
mands are written to the command register using  
standard microprocessor write timings, from where  
they are routed to an internal state-machine that  
controls the erase and programming circuits.  
Device programming is performed a byte at a time  
by executing the four-cycle Program Command.  
This initiates an internal algorithm that automati-  
cally times the program pulse widths and verifies  
proper cell margin.  
Erase Suspend enables the user to put erase on  
hold for any period of time to read data from, or  
program data to, any sector that is not selected  
for erasure. True background erase can thus be  
achieved. The device is fully erased when shipped  
from the factory.  
The HY29F002Ts sector erase architecture allows  
any number of array sectors to be erased and re-  
programmed without affecting the data contents  
of other sectors. Device erasure is initiated by  
executing the Erase Command. This initiates an  
internal algorithm that automatically preprograms  
the array (if it is not already programmed) before  
executing the erase operation. During erase  
cycles, the device automatically times the erase  
pulse widths and verifies proper cell margin.  
Addresses and data needed for the programming  
and erase operations are internally latched during  
write cycles, and the host system can detect  
completion of a program or erase operation by  
reading the DQ[7] (Data# Polling) and DQ[6]  
(toggle) status bits. Reading data from the device  
is similar to reading from SRAM or EPROM de-  
vices. Hardware data protection measures include  
a low VCC detector that automatically inhibits write  
operations during power transitions.  
To protect data in the device from accidental or  
unauthorized attempts to program or erase the  
device while it is in the system (e.g., by a virus),  
The host can place the device into the standby  
mode. Power consumption is greatly reduced in  
this mode.  
BLOCK DIAGRAM  
DQ[7:0]  
STATE  
CONTROL  
ERASE VOLTAGE  
I/O BUFFERS  
DQ[7:0]  
GENERATOR AND  
COMMAND  
REGISTER  
SECTOR SWITCHES  
WE#  
CE#  
I/O CONTROL  
DATA LATCH  
OE#  
ELECTRONIC  
ID  
RESET#  
PROGRAM  
VOLTAGE  
GENERATOR  
Y-DECODER  
X-DECODER  
Y-GATING  
VSS  
2 MBIT  
FLASH  
MEMORY  
ARRAY  
VC C  
VC C DETECTOR  
TIMER  
A[17:0]  
(7 Sectors)  
Rev. 4.1/May 01  
2
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