H5PS1G43EFR
H5PS1G83EFR
H5PS1G63EFR
3. AC & DC Operating Conditions
3.1 DC Operating Conditions
3.1.1 Recommended DC Operating Conditions (SSTL_1.8)
Rating
Symbol
Parameter
Supply Voltage
Units
Notes
Min.
Typ.
Max.
VDD
VDDL
VDDQ
VREF
VTT
1.7
1.8
1.9
V
V
1
1.7
1.8
1.8
1.9
1,2
1,2
3,4
5
Supply Voltage for DLL
Supply Voltage for Output
Input Reference Voltage
Termination Voltage
1.7
1.9
V
0.49*VDDQ
VREF-0.04
0.50*VDDQ
VREF
0.51*VDDQ
VREF+0.04
mV
V
Note:
1. Min. Typ. and Max. values increase by 100mV for C3(DDR2-533 3-3-3) speed option.
2. VDDQ tracks with VDD,VDDL tracks with VDD. AC parameters are measured with VDD,VDDQ and VDD.
3. The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the
value of VREF is expected to be about 0.5 x VDDQ of the transmitting device and VREF is expected to track varia-
tions in VDDQ
4. Peak to peak ac noise on VREF may not exceed +/-2% VREF (dc).
5. VTT of transmitting device must track VREF of receiving device.
3.1.2 ODT DC electrical characteristics
PARAMETER/CONDITION
SYMBOL MIN NOM MAX UNITS NOTES
Rtt effective impedance value for EMR(A6,A2)=0,1; 75 ohm
Rtt effective impedance value for EMR(A6,A2)=1,0; 150 ohm
Rtt effective impedance value for EMR(A6,A2)=1,1; 50 ohm
Deviation of VM with respect to VDDQ/2
Rtt1(eff)
Rtt2(eff)
Rtt3(eff)
delta VM
60
120
40
75
150
50
90
180
60
ohm
ohm
ohm
%
1
1
1
1
-6
+6
Note:
1. Test condition for Rtt measurements
Measurement Definition for Rtt(eff): Apply VIH (ac) and VIL (ac) to test pin separately, then measure current I(VIH (ac))
and I(VIL(ac)) respectively. VIH (ac), VIL (ac), and VDDQ values defined in SSTL_18
V
IH (ac) - VIL (ac)
Rtt(eff) =
I(VIH (ac)) - I(VIL (ac))
Measurement Definition for VM: Measurement Voltage at test pin (mid point) with no load.
2 x Vm
delta VM =(
- 1) x 100%
VDDQ
Rev. 0.4 / Nov 2008
11
HYNIX [ HYNIX SEMICONDUCTOR ]
