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GS1559_08 参数 Datasheet PDF下载

GS1559_08图片预览
型号: GS1559_08
PDF下载: 下载PDF文件 查看货源
内容描述: HD- LINX II多速率解串器,带环通电缆驱动器 [HD-LINX II Multi-Rate Deserializer with Loop-Through Cable Driver]
分类和应用: 驱动器
文件页数/大小: 71 页 / 1322 K
品牌: GENNUM [ GENNUM CORPORATION ]
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4.13 JTAG  
When the JTAG/HOST input pin of the GS1559 is set HIGH, the Host Interface port will  
be configured for JTAG test operation. In this mode, pins H4 to H6 and J6 become TMS,  
TCK, TDO, and TDI. In addition, the RESET_TRST pin will operate as the test reset pin.  
Boundary scan testing using the JTAG interface will be enabled in this mode.  
There are two methods in which JTAG can be used on the GS1559:  
1. As a stand-alone JTAG interface to be used at in-circuit ATE (Automatic Test  
Equipment) during PCB assembly; or  
2. Under control of the host for applications such as system power on self tests.  
When the JTAG tests are applied by ATE, care must be taken to disable any other devices  
driving the digital I/O pins. If the tests are to be applied only at ATE, this can be  
accomplished with tri-state buffers used in conjunction with the JTAG/HOST input  
signal. This is shown in Figure 4-14.  
Application HOST  
GS1559  
CS_TMS  
SCLK_TCK  
SDIN_TDI  
SDOUT_TDO  
JTAG_HOST  
In-circuit ATE probe  
Figure 4-14: In-Circuit JTAG  
Alternatively, if the test capabilities are to be used in the system, the Host may still  
control the JTAG/HOST input signal, but some means for tri-stating the Host must exist  
in order to use the interface at ATE. This is represented in Figure 4-15.  
Application HOST  
GS1559  
CS_TMS  
SCLK_TCK  
SDIN_TDI  
SDOUT_TDO  
JTAG_HOST  
Tri-State  
In-circuit ATE probe  
Figure 4-15: System JTAG  
Please contact your Gennum representative to obtain the BSDL model for the GS1559.  
GS1559 HD-LINX™ II Multi-Rate Deserializer with  
Loop-Through Cable Driver  
Data Sheet  
63 of 71  
30572 - 8  
July 2008  
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