MBM29LV160TE/BE-70/90/12
2. AC Characteristics
• Read Only Operations Characteristics
Parameter
Symbols
70
(Note)
90
(Note)
12
(Note)
Description
Test Setup
Unit
JEDEC Standard
tAVAV
tAVQV
tRC
Read Cycle Time
—
Min.
Max.
70
70
90
90
120
120
ns
ns
CE = VIL
OE = VIL
tACC
Address to Output Delay
tELQV
tGLQV
tEHQZ
tGHQZ
tCE
tOE
tDF
tDF
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output HIGH-Z
Output Enable to Output HIGH-Z
OE = VIL Max.
70
30
25
25
90
35
30
30
120
50
ns
ns
ns
ns
—
—
—
Max.
Max.
Max.
30
30
Output Hold Time From Address,
CE or OE, Whichever Occurs First
tAXQX
—
tOH
—
—
—
Min.
Max.
Max.
0
20
5
0
20
5
0
20
5
ns
tREADY
RESET Pin Low to Read Mode
s
µ
tELFL
tELFH
—
CE or BYTE Switching Low or High
ns
Note : Test Conditions:
Output Load:1 TTL gate and 30 pF (MBM29LV160TD/BD-70)
1 TTL gate and 100 pF (MBM29LV160TD/BD-90/12)
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to 3.0 V
Timing measurement reference level
Input: 1.5 V
Output:1.5 V
3.3 V
IN3064
or Equivalent
2.7 kΩ
Device
Under
Test
6.2 kΩ
CL
Diodes = IN3064
or Equivalent
Figure 4 Test Conditions
30
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