MBM29LV160TE/BE-70/90/12
■ ERASE AND PROGRAMMING PERFORMANCE
Limits
Typ.
Parameter
Unit
s
Comments
Min.
Max.
Excludes programming time
prior to erasure
Sector Erase Time
—
1
10
Byte Programming Time
Word Programming Time
—
—
8
300
360
Excludes system-level
overhead
µs
16
Excludes system-level
overhead
Chip Programming Time
Erase/Program Cycle
—
16.8
—
50
—
s
100,000
cycle
—
■ PIN CAPACITANCE
Parameter
Input Capacitance
Symbol
Test Setup
Typ.
Max.
7.5
10
Unit
pF
CIN
VIN = 0
VOUT = 0
VIN = 0
6
8
Output Capacitance
Control Pin Capacitance
COUT
CIN2
pF
7.5
9
pF
Note: Test conditions TA = 25°C, f = 1.0 MHz
33
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