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MC33810 参数 Datasheet PDF下载

MC33810图片预览
型号: MC33810
PDF下载: 下载PDF文件 查看货源
内容描述: 汽车发动机控制IC [Automotive Engine Control IC]
分类和应用:
文件页数/大小: 34 页 / 878 K
品牌: FREESCALE [ Freescale ]
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ELECTRICAL CHARACTERISTICS  
MAXIMUM RATINGS  
ELECTRICAL CHARACTERISTICS  
MAXIMUM RATINGS  
Table 2. Maximum Ratings  
All voltages are with respect to ground unless otherwise noted.  
Ratings  
Symbol  
Value  
Unit  
ELECTRICAL RATINGS  
VPWR Supply Voltage(1)  
VDD Supply Voltage(1)  
V
-1.5 to 45  
-0.3 to 7.0  
-0.3 to VDD  
V
V
V
PWR  
DC  
DC  
DC  
V
DD  
SPI Interface and Logic Input Voltage (CS, SI, SO, SCLK, OUTEN,  
DIN0 - DIN3, GIN0 - GIN3, SPKDUR, NOMI, MAXI, RSP,RSN)  
VIL  
VIH  
IGBT/General Purpose Gate Pre-driver Drain Voltage (VFB0 to VFB3  
Injector Output Voltage (OUTx)  
)
VFB  
-1.5 to 60  
-1.5 to 60  
-0.3 to 10  
100  
V
V
V
DC  
DC  
DC  
V
OUTX  
General Purpose Gate Pre-driver Output Voltage (GDx)  
V
GDx  
Output Clamp Energy (OUT0 to OUT3)(Single Pulse)  
TJUNCTION = 150°C, IOUT = 1.5A  
E
mJ  
mJ  
A
CLAMP  
Output Clamp Energy (OUT0 to OUT3)(Continuous Pulse)  
E
100  
2.0  
CLAMP  
TJUNCTION = 125°C, IOUT = 1.0A (Max Injector frequency is 70Hz)  
Output Continuous Current (OUT0 to OUT3)  
TJUNCTION = 150°C  
IOSSSS  
Maximum Voltage for RSN and RSP inputs  
Frequency of SPI Operation (VDD = 5.0V)  
V
-0.3 - VDD  
6.0  
V
DC  
RSX  
MHz  
ESD Voltage(2), (3)  
V
VESD1  
VESD2  
VESD3  
±2000  
±200  
±750  
Human Body Model (HBM)  
Machine Model (MM)  
Charge Device Model (CDM)  
THERMAL RATINGS  
Operating Temperature  
Ambient  
°C  
TA  
TJ  
-40 to 125  
-40 to 150  
-40 to 125  
Junction2  
Case  
TC  
Storage Temperature  
T
-55 to 150  
1.7  
°C  
W
STG  
Power Dissipation (T = 25°C)  
P
D
A
Peak Package flow Temperature During Solder Mounting  
TSOLDER  
°C  
DWB Suffix  
EW Suffix  
240  
245  
Thermal Resistance  
Junction-to-Ambient  
Junction- to-Lead  
Junction-to-Flag  
°C/W  
R
R
R
75  
8.0  
1.2  
JA  
θJL  
θJC  
θ
Notes  
1. Exceeding these limits may cause malfunction or permanent damage to the device.  
2. ESD data available upon request.  
3. ESD testing is performed in accordance with the Human Body Model (HBM) (AEC-Q100-002), the Machine Model (MM) (AEC-Q100-  
003), and the Charge Device Model (CDM), Robotic (AEC-Q100-011).  
33810  
Analog Integrated Circuit Device Data  
Freescale Semiconductor  
5
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